회전평광법을 이용한 낮은 셀갭 측정

Application of rotating polarizer method for small cellgap measurement

본 논문에서는 기존의 회전펴광자법에서 낮은 셀갭을 측정할 경우 발생하는 문제점을 보완하기 위하여 수치 해석적인 방법과 위상지연판을 이용한 방법을 도입하였으며 실험적 결과로부터 낮은 셀갭이 측정됨을 보였다.

Measurement of low cell gap and retardation by using a rotating polarizer method was proposed. For more precise calculation and measurement, we applied a simple numerical calculation and a retardation film that has large retardation value of 1 ~m to measurement system. From experiments, we proved that cell gap and retardation could be measured even though the values of those are so small. small.