SOC 테스트 기술 동향

References

1. IEEE Design & Test of Computers Introducing Core-Based System Design R.K. Gupta;Y. Zorian
2. IEEE International Test Conference Towards a Standard for Embedded Core Test : An Example E.J. Marinissen;Y. Zorian;R. Kapur;T. Taylor;L. Whetsel
3. IEEE P1500 Web Site
4. IEEE Standard Test Access Port and Boundary-Scan Architecture-IEEE Std. 1149.1-1990. IEEE IEEE Computer Society
5. IEEE International Test Conference A Structured Test Re-Use Methodology for Core-Based System Chips P. Varma;S. Bhatia
6. IEEE International Test Conference A Structured And Scalable Mechanism for Test Access to Embedded Reusable Cores E.J. Marinissen
7. IEEE International Test Conference On Using IEEE P150 SECT for Test Plug-n-Play E.J. Marinissen;R. Kapur;Y. Zorian
8. Proc. of Design Automation Conference System-Chip Test Strategies Y. Zorian