Journal of the Korean Crystal Growth and Crystal Technology (한국결정성장학회지)

The Korea Association of Crystal Growth (한국결정성장학회)
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Preparation of $Pb_{1-x}La_x(Zr_{1/2}Ti_{1/2})_{1-{x/4}}O_3$ thin films by a sol-gel method using a polypropanediol

Polypropanediol을 이용한 sol-gel법에 의한$Pb_{1-x}La_x(Zr_{1/2}Ti_{1/2})_{1-{x/4}}O_3$박막의 제조

  • 김태희 (안동대학교 신소재공학부) ;
  • 박경봉 (안동대학교 신소재공학부) ;
  • 김찬규 (안동대학교 신소재공학부)
  • Published : 2002.08.01
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Abstract

The PLZT (x/50/50, x = 1, 2, 5, 7) thin films have been prepared by a sol-gel method using polypropanediol as a solvent, and their dielectric properties have been investigated. The prepared sol was coated 10 times on $Pt/Ti/SiO2_2$/Si wafer. After post-annealing at 560~$600^{\circ}C$ for 10 min, the 600 nm-thick PLZT (x/50/50) thin films were formed with pure perovskite phase. Grain size of the PLZT (x/50/50) thin films was increased with increasing the amount of La. For all the compositions, dielectric properties such as dielectric constant and remnant polarization were enhanced with increasing annealing temperatures. As the amount of La was increased, the remnant polarization, coercive field and dielectric constant of the PLZT (x/50/50) thin films fired at $600^{\circ}C$ were decreased.

용매제로서 polypropanediol을 사용한 sol-gel법으로, La의 함량을 1, 2, 5, 7 ㏖%로 변화시킨 PLZT(x/50/50) 박막을 제조하고 La 함량에 따른 유전특성의 변화를 연구하였다. 제조한 sol을 사용하여 $Pt/Ti/SiO_2$/Si 위에 10회 코팅한 후, 560~$600^{\circ}C$까지 10분간 열처리하여 600nm 두께의 박막을 얻을 수 있었다 $560^{\circ}C$ 이상에서는 조성에 관계없이 perovskite 단일 상만이 나타났고, La 함량이 증가함에 따라 입자 크기가 증가하였다. 모든 조성의 박막에서 열처리 온도가 증가함에 따라 유전상수 및 잔류분극 값이 증가되었으며 $600^{\circ}C$에서 열처리한 박막이 가장 우수한 유전 특성을 나타내었다. $600^{\circ}C$에서 열처리한 박막에서 La함량이 증가함에 따라 잔류분극, 항전계, 유전상수 모두 감소하였다.

Keywords

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