Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Analytical Expressions of Temperature Dependent Breakdown Voltage and On-Resistance for Si Power MOSFETs

실리콘 전력 MOSFET의 온도 관련 항복 전압과 ON 저항을 위한 해석적 표현

  • 정용성 (서라벌대학 디지털전기정보학부)
  • Published : 2003.05.01
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Abstract

Analytical Expressions of temperature dependent breakdown voltage and on-resistance for silicon power MOSFETs are induced by employing the temperature dependent effective ionization coefficient extracted from temperature dependent ionization coefficients for electron and hole, and electron mobility in silicon. The analytical results for temperature dependent breakdown voltage are compared with experimental results for tile doping concentration, 4x10$^{14}$ cm$^{-3}$ , 1x10$^{15}$ cm$^{-3}$ , 6x10$^{16}$ cm$^{-3}$ respectively. The variations of temperature dependent on-resistance and breakdown voltage dependent ideal specific on-resistance are also compared with the ones reported previously. Good fits with the experimental results ate found for the breakdown voltages within 10% in error for the temperature in the range of 77~300K at each doping concentration.

전자와 정공의 온도 관련 이온화 계수로부터 추출한 온도 함수의 유효 이온화 계수 및 전자 이동도를 이용하여 실리콘 전력 MOSFET의 항복 전압과 on 저항을 위한 온도 함수의 해석적 표현식을 유도하였다. 온도 함수의 해석적 항복 전압 결과를 4x10/sup 14/ cm/sup -3/, 1x10/sup 15/ cm/sup -3/, 6x10/sup 16/ cm/sup -3/의 도핑 농도에 대해 각각 실험 결과와 비교하였고, 온도 및 항복 전압 함수의 on 저항 변화도 각각 실험 결과와 비교하였다. 각농도에 따른 온도 함수의 해석적 항복 전압은 77∼300k의 온도 범위에서 실험 결과와 10% 이내의 오차로 잘 일치하였다.

Keywords

References

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