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Heavy Carbon Incorporation into High-Index GaAs

고농도로 탄소 도핑된 높은 밀러 지수 GaAs

  • 손창식 (신라대학교 공과대학 광전자공학과)
  • Published : 2003.11.01

Abstract

Heavily $p^{ +}$-typed ($10^{20}$ $cm^{-3}$ ) GaAs epilayers have been grown on high-index GaAs substrates with various crystallographic orientations from (100) to (111)A by a low-pressure metalorganic chemical vapor deposition. Carbon (C) tetrabromide (CBr$_4$) was used as a C source. At moderate growth temperatures and high V/III ratios, the hole concentration of C-doped GaAs epilayers shows the crystallographic orientation dependence. The bonding strength of As sites on a growing surface plays an important role in the C incorporation into the high-index GaAs substrates.

Keywords

References

  1. A. W. Nelson and L. D. Westbrook, J. Crystal Growth, 68, 102 (1984) https://doi.org/10.1016/0022-0248(84)90404-4
  2. S. A. Stockman, G. E. Hfler, J. N. Baillargeon, K. C. Hsieh, K. Y. Cheong and G. E. Stillman, J. Appl. Phys., 72, 981 (1992) https://doi.org/10.1063/1.351776
  3. Y. Ashizawa, T. Noda, K. Morizuka, M. Asaka, A. W. Nelson and M. Obara, J. Crystal Growth, 107, 903 (1991) https://doi.org/10.1016/0022-0248(91)90578-S
  4. G. R. Moriaty, M. Murtagh, K. Cherkaoui, G. Gouez, P. V Kelly, G. M. Crean and S. W. Bland, Mater. Sci. Eng., B56, 284 (2001) https://doi.org/10.1016/S0921-5107(00)00642-5
  5. H. S. Lee, W. Y. Han, Y. Lu, M. W. Cole, R. T. Lareau, L. Casas, R. J. Thompson, A. DeAnni, K. A. Jones and L. W. Yang, Mat. Res. Soc. Sym. Proc., 240, 467 (1992)
  6. C. R. Abernathy, S. J. Pearton, F. Ren, W. S. Hobson, T. R. Fullowan, A. Katz, A. S. Jordan and J. Kovalchick, J. Crystal Growth, 105, 375 (1990) https://doi.org/10.1016/0022-0248(90)90389-3
  7. L. Q. Guo and M. Konagai, Jpn. J. Appl. Phys., 35, L 195 (1996) https://doi.org/10.1143/JJAP.35.L195
  8. R. M. Lum, J. K. Klingert, D. W. Kisker, S. M. Abys and F. A. Stevie, J. Crystal Growth, 93, 120 (1988) https://doi.org/10.1016/0022-0248(88)90516-7
  9. C. Anayama, H. Sekiguchi, M. Kondo, H. Sudo, T. Fukushima, A. Furuya and T. Tanahashi, Appl. Phys. Lett., 63, 1736 (1993) https://doi.org/10.1063/1.110699
  10. R. Bhat, C. E. Zah, C. Caneau, M. A. Koza, S. G. Menocal, S. A. Schwarz and F. J. Favire, Appl. Phys. Lett., 56, 1691 (1990) https://doi.org/10.1063/1.103119
  11. N. Y. Li, H. K. Dong, C. W. Tu and M. Geva, Crystal Growth, 150, 246 (1995) https://doi.org/10.1016/0022-0248(95)80215-X
  12. N. I. Buchan, T. F. Kuech, G. J. Scilla and F. Cardone, J. Crystal Growth, 110, 405 (1991) https://doi.org/10.1016/0022-0248(91)90276-B
  13. P. Kurpas, E. Richter, D. Gutsche, F. Brunner and M. Weyers, Inst. Phys. Conf. Ser., 145, 177 (1995)
  14. C. S. Son, S. I. Kim, Y. Kim, Y. K. Park, S. K. Min and I. H. Choi, J. Appl. Phys., 82, 1205 (1997) https://doi.org/10.1063/1.366264
  15. M. Kondo, C. Anayama, N. Okada, H. Sekiguchi, K. Domen and T. Tanahashi, J. Appl. Phys., 76, 914 (1994) https://doi.org/10.1063/1.357769