International Journal of Quality Innovation

Korean Society for Quality Management (한국품질경영학회)
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The Application of Machine Vision to IC Surface Inspection

  • Chung, Yi-Chan (Department of Industrial Engineering and Management Ta-Hwa Institute of Technology) ;
  • Tsai, Chih-Hung (Department of Industrial Engineering and Management Ta-Hwa Institute of Technology) ;
  • Lin, Yu-Tang (Department of Industrial Engineering and Management Ta-Hwa Institute of Technology)
  • Published : 2003.12.01
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Abstract

During IC inspection, which includes the two parts of Mark and Lead, the deviation of IC on the tape occurring in high speed movements usually generates light reflection effect, which in turn causes errors in IC recognition as measured by machine vision system. This research filters the light reflection effect by developing standard components, identifies the correct position of IC Lead, hence fixes the measurement errors or non-measurability caused by light reflection, avoids the resulting discontinued operation of measuring system, and improves the productivity.

Keywords

References

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