KIEE International Transactions on Electrophysics and Applications

대한전기학회 (The Korean Institute of Electrical Engineers)
권호 표지

Electrode Thickness Optimization at Full Color OLED and Analysis of Power Consumption

  • Park, Sung-Joon (Dept. of Electrical Engineering, Pusan national University) ;
  • Kim, Ok-Tae (Dept. of Electrical Engineering, Kyungpook National University) ;
  • Kim, Hee-Je (Dept. of Electrical Engineering, Pusan national University)
  • 발행 : 2004.06.01
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초록

The operating condition of the OLED (organic light-emitting diode) is very sensitive to electrode thickness properties. The electrode thickness is a significant issue in the construction of OLEDs because of its transparency, high conductivity and high efficiency as an injector into organic materials. We carried out a systematic study to optimize the electrode thickness conditions in Indiumtin oxide (ITO), Molybdenum (Mo) and Aluminum (Al). Further, we measured electrode thickness under standard conditions [ITO 1500$\AA$, Mo 2600$\AA$, Al 1500$\AA$]. We also evaluated power consumption. In addition, we analyzed substrate uniformity with IVL measurement results. From these results, it is known that the electrode thickness should be optimized in order to accomplish optimal power efficiency.

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참고문헌

  1. C. W. Tang. S. A. Vanslyke, Appl. phys. Lett. 51 (1987)913
  2. J. H. Burroughes, D.D.C. Bradley, AR Brown, R. N. Marks, K. Mackay, R. H. Friend, P. L. Burns, A. B. Holms, Nature 347(1990)539
  3. P. E. Burrows, G. Gu, V. Bulovic, Z. Shen, S. R. Forrest, and M. E. Thompson 'Achieving Full-Color Organic Light-Emitting Devices for Lightweight, FlatPanel Displays', IEEE Trans. Electron device, vol. 44, pp.1188-1998, 1987
  4. S. A VanSlyke, C. H. Chen and C. W. Tang, 'Organic electroluminescence devices with improved stability', Appl Phys. Lett., vol. 69, pp.2160-2162, 1996
  5. S. W. Kim et al. / '2.4in. monochrome small molecular OLED display for mobile application', Current Applied Physics 2. pp. 335-338, 2002
  6. Y. Kijima, N. Asai, N. Kishii, S.-i. Tamura, IEEE Trans. Electron Dev. vol. 44(8), pp 1222-1228, 1997