Journal of Magnetics

The Korean Magnetics Society (한국자기학회)
권호 표지
DOI QR코드

DOI QR Code

High Resolution Magnetic X-ray Microscopy Study of the Magnetization Reversal in CoCrPt Alloy Thin Films

  • Im, Mi-Young (Department of Physics and Center for Nanospinics of Spintronic Materials, Korea Advanced Institute of Science and Technology) ;
  • Fischer, Peter (Max-Planck-Institute for Metals Research, Heisenbergstrasse) ;
  • Eimiiller, Thomas (Max-Planck-Institute for Metals Research, Heisenbergstrasse) ;
  • Shin, Sung-Chul (Department of Physics and Center for Nanospinics of Spintronic Materials, Korea Advanced Institute of Science and Technology)
  • Published : 2004.09.01
Download PDF
⟨ Previous Next ⟩

Abstract

Magnetic transmission soft X-ray microscopy has been used to study element-specifically the magnetization reversal behavior of ${(Co_{84}Cr_{16})}_{87}Pt_{l3}$ alloy thin films with a lateral resolution of 35 nm. Our results indicate that the magnetization switching is carried out by a random nucleation process that can be attributed to the reversal of individual grains. We found evidence of a large distribution of the switching fields at the nanogranular length scale, which has to be considered seriously for applications of CoCrPt systems as magnetic high density storage materials.

Keywords

References

  1. M. Futamoto, et aI.,IEEE Trans. Magn. 35, 2802 (1999) https://doi.org/10.1109/20.800989
  2. G. Wastlbauer, et aI., Appl. Phys. Lett. 76, 619 (2000) https://doi.org/10.1063/1.125837
  3. L. Tang, L. L. Lee, D. E. Laughlin, and D. N. Lambeth, Appl. Phys. Lett. 69, 1163 (1996) https://doi.org/10.1063/1.117382
  4. O. Kitakami, et aI., J. Magn. Magn. Mater. 202, 305 (1999) https://doi.org/10.1016/S0304-8853(99)00368-6
  5. J. Pommier, et al., Phys. Rev. Lett. 65, 2054 (1990) https://doi.org/10.1103/PhysRevLett.65.2054
  6. S.-B. Choe and S.-C. Shin, Phys. Rev. B 57, 1085 (1998)
  7. Y. Matsuda, Y. Yahisa, J. Inagaki, and A. Ishikawa, J. AppI. Phys. 79, 5351 (1996) https://doi.org/10.1063/1.361322
  8. N. Inaba, T. Yamamoto, Y. Hosoe, and M. Futamoto, J. Magn. Magn. Mater. 168, 222 (1997) https://doi.org/10.1016/S0304-8853(96)00681-6
  9. Y. Xu, J. P. Wang, and Y. Su, J. AppI. Phys. 87, 6971 (2000) https://doi.org/10.1063/1.372903
  10. Z. Zhou and Y. Fan, Thin Solid Films 272, 43 (1996) https://doi.org/10.1016/0040-6090(95)06065-0
  11. M. van Kooten, et aI., J. Magn. Magn. Mater. 120, 145 (1993) https://doi.org/10.1016/0304-8853(93)91307-S
  12. P. Fischer, et al., Z. f. Physik B 101, 313 (1996)
  13. P. Fischer, Current Opinion in Solid State and Materials Science 7, 173 (2003) https://doi.org/10.1016/S1359-0286(03)00002-0
  14. W. Chao, et aI., Optics Letters 28, 2019 (2003) https://doi.org/10.1364/OL.28.002019
  15. P. Fischer, et aI., Rev. Sci. Instr. 72(5), 2322 (2001) https://doi.org/10.1063/1.1351840
  16. M.-Y. Im, et aI., AppI. Phys. Lett. 83, 4589 (2003) https://doi.org/10.1063/1.1631752