Journal of Magnetics

The Korean Magnetics Society (한국자기학회)
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NiO Thickness Dependences of Perpendicular Magnetic Anisotropy in the [CoFe/Pt] Multilayers

  • Kim, S.W (Department of Computer and Electronic Physics, Sangji University) ;
  • Lee, J.Y (Department of Computer and Electronic Physics, Sangji University) ;
  • Lee, S.S (Department of Computer and Electronic Physics, Sangji University) ;
  • Hahn, E.J (Department of Physics, Suwon University) ;
  • Hwang, D.G (Department of Computer and Electronic Physics, Sangji University)
  • Published : 2004.12.01
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Abstract

NiO thickness dependences of perpendicular magnetic anisotropy (PMA) in the $NiO/[CoFe/Pt]_5$ multilayers for exchange biasing and $[CoFe/Pt]_4/Pt/[CoFe/Pt]_4$ for interlayer exchange coupling were investigated. Perpendicular magnetization curve was obtained by out-of-plane extraordinary Hall measurement. Magnetic force microscopy (MFM) has been used for the investigation of magnetic domains on thin films. We confirmed that the interlayer exchange coupling (IEC) as a function of NiO thickness at room temperature existed with a period of two monolayers.

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References

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