Korean Journal of Materials Research (한국재료학회지)

Materials Research Society of Korea (한국재료학회)
권호 표지
DOI QR코드

DOI QR Code

Thermoelectric Properties of Co1-xNbxSb3 Prepared by Induction Melting

유도용해법으로 제조된 Co1-xNbxSb3의 열전특성

  • Park J.B. (Dept. of Materials Science and Engineering/NT Lab., Chungju National University) ;
  • You S.W. (Dept. of Materials Science and Engineering/NT Lab., Chungju National University) ;
  • Cho K.W. (Dept. of Materials Science and Engineering/NT Lab., Chungju National University) ;
  • Jang K.W. (Dept. of Advanced Materials Engineering, Hanseo University) ;
  • Lee J.I. (Dept. of Materials Science and Engineering/NT Lab., Chungju National University) ;
  • Ur S.C. (Dept. of Materials Science and Engineering/NT Lab., Chungju National University) ;
  • Kim I.H. (Dept. of Materials Science and Engineering/NT Lab., Chungju National University)
  • 박종범 (충주대학교 신소재공학과/나노기술연구소) ;
  • 유신욱 (충주대학교 신소재공학과/나노기술연구소) ;
  • 조경원 (충주대학교 신소재공학과/나노기술연구소) ;
  • 장경욱 (한서대학교 신소재공학과) ;
  • 이정일 (충주대학교 신소재공학과/나노기술연구소) ;
  • 어순철 (충주대학교 신소재공학과/나노기술연구소) ;
  • 김일호 (충주대학교 신소재공학과/나노기술연구소)
  • Published : 2005.02.01
Download PDF
⟨ Previous Next ⟩

Abstract

The induction melting was employed to prepare Nb-doped $CoSb_3$ skutterudites and their thermoelectric properties were investigated. Single phase $\delta-CoSb_3$ was successfully obtained by induction melting and subsequent annealing at $400^{\circ}C$ for 2 hrs in vacuum. The positive signs of Seebeck coefficients for all the specimens revealed that Nb atoms acted as p-type dopants by substituting Co atoms. Electrical conductivity decreased and then increased with increasing temperature, indicating mixed conduction behavior. Electrical conductivity increased by Nb doping, and it was saturated at high temperature. Maximum value of the thermoelectric power factor was shifted to higher temperature with increasing the amount of Nb doping, mainly originated from the high Seebeck coefficient around mixed conduction temperature and high electrical conductivity.

Keywords

References

  1. J. W. Sharp, E. C. Jones, R. K. Williams, P. M. Martin and B. C. Sales, J. Appl. Phys., 78, 1013 (1995) https://doi.org/10.1063/1.360402
  2. T. Caillat, A. Borshchevski and J.-P. Fleurial, Proc. 13th Intl. Conf. Thermoelectrics, 58 (1994)
  3. Y. Kawaharada, K. Kurosaki, M. Uno and S. Yamanaka, J. Alloys & Comp., 315, 193 (200l) https://doi.org/10.1016/S0925-8388(00)01275-5
  4. T. Caillat, A. Borshchevski and J.-P. Fleurial, J. Appl. Phys., 80(8) 4442 (1996) https://doi.org/10.1063/1.363405
  5. H. Anno, K. Matsubara, Y. Notohara, T. Sakakibara and H. Tashiro, J. Appl. Phys., 86(7), 3780(1999) https://doi.org/10.1063/1.371287
  6. D.-T. Morelli, G.-P. Meisner, B.X. Chen, S.Q. Hu and C. Uher, Phys. Rev., B56, 7376 (1997) https://doi.org/10.1103/PhysRevB.56.7376
  7. G. P. Meisner, D. T. Morelli, S. Hu, J. Yang and C. Uher, Phys. Rev. Lett., 80(16), 3551 (1998) https://doi.org/10.1103/PhysRevLett.80.3551
  8. H. Kitagawa, M. Hasaka, T. Morimura, H. Nakashima and S. Kondo, Mater. Res. Bull., 35, 185 (2000) https://doi.org/10.1016/S0025-5408(00)00203-8
  9. K. T. Wojciechowski, J. Tobola and J. Leszczynski, J. Alloys & Comp., 361, 19 (2003) https://doi.org/10.1016/S0925-8388(03)00411-0
  10. D. T. Morelli, T. Caillat, I.-P. Fleurial, A. Borshchevski, J. Vandersande, B. Chen and C. Uher, Phys. Rev., B51, 9622 (1995) https://doi.org/10.1103/PhysRevB.51.9622
  11. P. Feschotte and D. Lorin, J. Less-Common Metals, 155, 255 (1989) https://doi.org/10.1016/0022-5088(89)90235-X
  12. H. Tashiro, Y. Notohara, T. sakaibara, H. Anno and K. Matsubara, Proc. 16th Intl. Conf. Thermoelectrics, 326 (1997)
  13. Y. Nakamoto, K. Tanaka and T. Koyanagi, Proc. 17th Intl. Conf. Thermoelectrics, 302 (1998)
  14. I. H Kim, S. W. You, J. B. Park, M. K. Choi, K. W. Cho, S. C. Ur, G. S. Choi, B. G. Kim, W. B. Kim and J. S. Kim, Proc. 23rd Intl. Conf. Thermoelectrics (2004, in press)
  15. I.-H. Kim, G.-S. Choi, M.-G. Han, J.-S. Kim, J.-I. Lee, S.C. Ur, T.-W. Hong, Y.-G. Lee and S.-L. Ryu, Mater. Sci. Forum, 449, 917 (2004) https://doi.org/10.4028/www.scientific.net/MSF.449-452.917
  16. S. Katsuyama, M. Watanabe, M. Kuroki, T. Maehata and M. Ito, J. Appl. Phys., 93(5) 2758 (2003) https://doi.org/10.1063/1.1545158
  17. K. Matsubara, T. Sakakibara, Y. Notohara, H. Anno, H. Shimuzu and T. Koyanagi, Proc. 15th Intl. Conf. Thermoelectrics, 96 (1996)