Communications for Statistical Applications and Methods

  • 제12권3호
  • /
  • Pages.625-634
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  • 2005
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  • 2287-7843(pISSN)
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  • 2383-4757(eISSN)
한국통계학회 (The Korean Statistical Society)
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V-mask Type Criterion for Identification of Outliers In Logistic Regression

  • Kim Bu-Yong (Department of Statistics, Sookmyung Women's University)
  • 발행 : 2005.12.01
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초록

A procedure is proposed to identify multiple outliers in the logistic regression. It detects the leverage points by means of hierarchical clustering of the robust distances based on the minimum covariance determinant estimator, and then it employs a V-mask type criterion on the scatter plot of robust residuals against robust distances to classify the observations into vertical outliers, bad leverage points, good leverage points, and regular points. Effectiveness of the proposed procedure is evaluated on the basis of the classic and artificial data sets, and it is shown that the procedure deals very well with the masking and swamping effects.

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참고문헌

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