A study on a Prediction of Dangerous Failure Rate in the Embedded System for the Track Side Functional Module

TFM에 대한 내장형제어기의 위험측고장률 예측에 관한 연구

  • 신덕호 (한국철도기술연구원 전기신호연구본부) ;
  • 이재훈 (광운대학교 제어계측공학과) ;
  • 이기서 (광운대학교 정보제어공학과)
  • Published : 2005.04.01

Abstract

This study presents a prediction of a failure rate in a safety required system that consists of a embedded control system, requiring a satisfaction of a quantitative safety requirement. International Standards are employed to achieve a regular procedures in the whole life cycle of a system, for the purpose of a prediction and a evaluation of a fault that might be able to be happened in a system. This International Standards uses SIL (Safety Integrity Level) to evaluate a safety level of a system. SIL is divided into 4 levels, from level 1 to level 4, and each level has functional failure rate and dangerous failure rate of a system. In this paper we describe the conventional method to predict the dangerous failure rate and propose a method using hazard analysis to predict the dangerous failure rate. The conventional method and the technique using hazard analysis to predict the dangerous failure rate are made a comparison through the control modules of the interlocking system in KTX. The proposed method verify better effectiveness for the prediction of the dangerous failure rate than that of the conventional method.

Keywords

References

  1. International Standard IEC61508 'Functional Safety of Electrical/ Electronic/Programmable electronic Safety -related systems
  2. Relex Software Guidebook
  3. Barry W. Johnson, 1989 'Design and Analysis of Fault-Tolerant Digital Systems'
  4. Felix Redmill et al. 'System Safety : HAZOP and Software HAZOP', John Wiley & Sons, 1999
  5. Defence Standard 00-58, 'HAZOP Studies on System Containing Programmable Electronics', 2000
  6. 건설교통부, 고속철도기술개발사업 '열차제어시스템 안정화기술 개발 2차년도 연차보고서'
  7. nternational Standard IEC61882 'HAZOP Studies - Application guide'