Analysis and Compression of Spun-yarn Density Profiles using Adaptive Wavelets

  • Published : 2006.10.27

Abstract

A data compression system has been developed by combining adaptive wavelets and optimization technique. The adaptive wavelets were made by optimizing the coefficients of the wavelet matrix. The optimization procedure has been performed by criteria of minimizing the reconstruction error. The resulting adaptive basis outperformed such conventional basis as Daubechies-5 by 5-10%. It was also shown that the yarn density profiles could be compressed by over 95% without a significant loss of information.

Keywords

References

  1. Wulfhost, B. and Friebel, W., Significance of Sliver Evenness for Yarn Quality, Melliand Textilberichte International, P. E37, 1986
  2. Furter, R., Evenness Testing in Yam Production. Part2, The Textile Institute, Manchester, England, 1982
  3. Jooyong Kim, Moon W. Suh, Characterization and Compression of Yam Density profiles by Multiresolution Analysis, J. Korean Fiber Soc., 38(1), 21-27(2001)
  4. Jooyong Kim, Moon W. Suh, Development of a Digital Process Infonnation System using Stochastic Models, J. Korean Fiber Soc., 38(2), 79-86(2001)
  5. Jasper, W. J., Garnier, S.J. and Potlapalli, H. Texture Characterization and Defect Detection Using Adaptive Wavelets, J. Korean Fiber Soc., 35(11), 3140-3149(1996)
  6. G. Wallace, The JPEG still picture compression standard, IEEE TCE, P.38, 1992
  7. Turcajova, R. and Kautsky, J., Shift Products and Factorizations of Wavelet Matrices, Numerical Algorithms, 41, 27-54(1994)
  8. Daubechies, 'Ten Lectures in Wavelets', SIAM, Philadelphia, Pennsylvania, 1992
  9. Mathworks$\circledR$ Inc., Optimization Toolbox User's Manual, 1996