Development of Integrated Variable Sampling Interval EngineeringProcess Control & Statistical Process Control System

가변 샘플링간격 EPC/SPC 결합시스템의 개발

  • 이성재 ((주)씨엠씨 6시그마 사업부) ;
  • 서순근 (동아대학교 산업경영공학과)
  • Published : 2006.09.30

Abstract

Traditional statistical process control (SPC) applied to discrete part industry in the form of control charts can look for and eliminate assignable causes by process monitoring. On the other hand, engineering process control (EPC) applied to the process industry in the form of feedback control can maintain the process output on the target by continual adjustment of input variable. This study presents controlling and monitoring rules adopted by variable sampling interval (VSI) to change sampling intervals in a predetermined fashion on the predicted process levels under integrated EPC and SPC systems. Twelve rules classified by EPC schemes(MMSE, constrained PI, bounded or deadband adjustment policy) and type of sampling interval combined with EWMA chart of SPC are proposed under IMA (1,1) disturbance model and zero-order (responsive) dynamic system. Properties of twelve control rules under three patterns of process change (sudden shift, drift and random shift) are evaluated and discussed through simulation and control rules for integrated VSI EPC and SPC systems are recommended.

Keywords

References

  1. Box, G. E. P. (1991), Bounded Adjustment Charts, Quality Engineering, 4, 331-338 https://doi.org/10.1080/08982119108918912
  2. Box, G. E. P. and Luceno, A. (1995), Discrete Proportional-Integral Control with Constrained Adjustment, Journal of the Royal Statistical Society, D-The Statistician. 44, 479-495
  3. Box, G. E. P. and Luceno, A. (1997a), Statistical Control by Monitoring and Feedback Adjustment, John Wiley & Sons, New York, USA
  4. Box, G. E. P. and Luceno, A. (1997b), Discrete Proportional-Integral Adjustment and Statistical Process Control, Journal of Quality Technology, 29, 248-260 https://doi.org/10.1080/00224065.1997.11979767
  5. Del Castillo, E. (2002), Statistical Process Adjustment for Quality Control, John Wiley & Sons, New York, USA
  6. Janakiram, M. and Keats, J. B. (1998), Combining SPC and EPC in a Hybrid Industry, Journal of Quality Technology, 30, 189-200 https://doi.org/10.1080/00224065.1998.11979848
  7. Lee, M. S. and Kim, K. J. (2005), A Comparative Study of SPC and EPC with a Focus on Their Integration, The Korean Society for Quality Management, 33, 22-31
  8. Lee, S. J. (2003), Development of Constrained Proportional-Integral Schemes and Integrated Variable Sampling Interval Engineering Process Control & Statistical Process Control System, Unpublished Ph. D. Dissertation, Dong-A University, Busan, Korea
  9. Lucas, J. M. and Saccucci, M. S. (1990), Exponentially Weighted Moving Average Control Schemes; Properties and Enhancements, Technometrics, 27, 1-12
  10. Montgomery, D. C. (2004), Introduction to Statistical Quality Control, 5th ed., John Wiley & Sons, New York, USA
  11. Montgomery, D. C., Keats, J. B., Runger, G. C., and Messina, W. S. (1994), Integrating Statistical Process Control and Engineering Process Control, Journal of Quality Technology, 26, 79-87 https://doi.org/10.1080/00224065.1994.11979508
  12. Montgomery, D. C. and Mastrangelo, W. S. (1991), Some Statistical Process Control Methods for Autocorrelated Data(with Discussion), Journal of Quality Technology, 23, 179-204 https://doi.org/10.1080/00224065.1991.11979321
  13. Reynolds, M. R., Jr., Amin, R. W., Arnold, J. C., and Nachlas, J. A. (1988), X Charts with Variable Sampling Intervals, Technometrics, 30, 181-191 https://doi.org/10.2307/1270164
  14. Ruhhal, N. H., Runger, G. C., and Dumitrescu, M. (2000), Control Charts and Feedback Adjustments for a Jump Disturbance Model, Journal of Quality Technology, 32, 379-394 https://doi.org/10.1080/00224065.2000.11980024
  15. Tsung, F. and Shi, J. (1999), Integrated Design of Run-To-Run PID Controller and SPC Monitoring for Process Disturbance Rejection, lIE Transactions, 31, 517-527
  16. Tsung, F. and Tsui, K. L. (2003), A Mean-Shift Pattern Study on Integration of SPC and APC for Process Monitoring, IIE Transactions, 35, 231-242 https://doi.org/10.1080/07408170304365
  17. Vander Wiel, S. A., Tucker, W. T., Faltin, F. W., and Doganaksoy, N. (1992), Algorithmic Statistical Process Control ; Concepts and an Application, Technometrics, 34, 286-297 https://doi.org/10.2307/1270035