Journal of the Korean Data and Information Science Society
- Volume 18 Issue 3
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- Pages.773-782
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- 2007
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- 1598-9402(pISSN)
A Study on the Monitoring of Reject Rate in High Yield Process
- Nam, Ho-Soo (Department of System & Management Engineering, Dongseo University)
- Published : 2007.08.31
Abstract
The statistical process control charts are very extensively used for monitoring of process mean, deviation, defect rate or reject rate. In this paper we consider a control chart to monitor the process reject rate in the high yield process, which is based on the observed cumulative probability of the number of items inspected until r defective items are observed. We first propose selection of the optimal value of r in the CPC-r charts, and also consider the usefulness of the chart in high yield process such as semiconductor or TFT-LCD manufacturing process.