Journal of the Korea Institute of Information and Communication Engineering (한국정보통신학회논문지)

The Korea Institute of Information and Commucation Engineering (한국정보통신학회)
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Defect Inspection of the Polarizer Film Using Singular Vector Decomposition

특이값 분해를 이용한 편광필름 결함 검출

  • 장경식 (동의대학교 멀티미디어공학과)
  • Published : 2007.05.31
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Abstract

In this paper, we propose a global approach for automatic inspection of defects in the polarizer film image. The proposed method does not rely on local feature of the defect. It is based on a global image reconstruction scheme using the singular value decomposition(SVD). SVD is used to decompose the image and then obtain a diagonal matrix of the singular values. Among the singular values, the first singular value is used to reconstruct a image. In reconstructed image, the normal pixels in background region have a different characteristics from the pixels in defect region. It is obtained the ratio of pixels in the reconstructed image to ones in the original image and then the defects are detected based on the the statistical process of the ratio. The experiment results show that the proposed method is efficient for defect inspection of polarizer lam image.

이 논문에서는 LCD에 사용되는 편광필름 영상에서 결함을 검출하는 방법을 제안하였다. 제안한 방법은 결함의 지엽적인 특징을 이용하는 것이 아니라 특이값 분해를 이용하여 영상의 전역적인 정보를 반영하는 방법이다. 편광필름 영상을 특이값 분해하고 특이값 중에서 첫 번째 특이값만을 사용하여 영상을 재구성하면 재구성한 영상에서 정상 부분의 화소값과 결함 부분의 화소값들은 서로 다른 특성을 나타낸다. 입력 영상과 재구성한 영상의 화소값 비를 구하고 확률론적 방법을 사용하여 결함을 검출하였다. 제안한 방법을 이용하여 여러 가지 결함을 갖는 편광필름 영상에서 결함을 검출한 결과 검출력이 매우 우수한 것으로 나타났다.

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References

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