대한전자공학회논문지SD (Journal of the Institute of Electronics Engineers of Korea SD)

대한전자공학회 (The Institute of Electronics and Information Engineers)
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Sol-gel 법으로 제작한 Al-doped ZnO 박막의 도핑 농도 및 열처리 온도에 따른 광학적 및 전기적 특성

Optical and Electrical Properties of Al-doped ZnO Thin Films Fabricated by Sol-gel Method with Various Al Doping Concentrations and Annealing Temperatures

  • 신현호 (인하대학교 전자공학과) ;
  • 강성준 (전남대학교 전기 및 반도체 공학과) ;
  • 윤영섭 (인하대학교 전자공학과)
  • Shin, Hyun-Ho (Dept. of Electronics Engineering, Inha University) ;
  • Kang, Seong-Jun (Dept. of Electrical and Semiconductor Engineering, Chonnam National University) ;
  • Yoon, Yung-Sup (Dept. of Electronics Engineering, Inha University)
  • 발행 : 2007.05.25
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초록

Sol-gel 법으로 quartz 기판 위에 Al 도핑 농도와 열처리 온도에 따른 AZO 박막을 제작하였다. 1 % Al 이 도핑되고 550 $^{\circ}C$ 에서 열처리한 ZnO 박막에서 가장 우수한 (002) 배향성과 가장 평탄한 박막 (1.084 nm) 이 제작되었다. 모든 박막은 가시광 영역에서 약 80 % 이상의 투과율을 보였으며, Al 농도가 증가할수록 에너지 밴드 갭이 넓어지는 Burstein-Moss 효과가 관찰되었다. Hall 측정 결과, 순수한 ZnO 박막보다 Al 이 도핑된 ZnO 박막에서 캐리어 농도의 증가와 비저항 값의 감소가 나타났다. 또, Al 의 도핑 농도가 증가함에 따라 segregation 효과로 인한 캐리어 농도의 감소와 비저항 값의 증가가 관찰되었다. 1% Al 이 도핑되고 550 $^{\circ}C$ 에서 열처리한 ZnO 박막에서 가장 큰 캐리어 농도 ($1.80{\times}10^{19}\;cm^{-3}$) 와 가장 낮은 비저항 (0.84 ${\Omega}cm$) 값을 나타내었다.

AZO thin films have been fabricated on quartz substrate with various Al doping concentrations and annealing temperatures by sol-gel method. The bset condition of (002) orientation and smooth surface (rms = 1.082 nm) is obtained for the AZO thin film doped with 1 mol % Al and annealed at 550 $^{\circ}C$. The optical transmittance of AZO thin films is higher than 80 % in the visible region. We observe that the energy band gap extends with increasing the Al doping concentration. This phenomenon is due to the Burstein-Moss effect. Through the measurement of Hall effect, it is observed that the AZO thin film has larger carrier concentration and smaller electrical resistivity than the pure ZnO thin film. However, the AZO thin film shows the decrease of carrier concentration and the increase of resistivity with the increase of Al concentration, that is due to the segregation of Al at grain boundaries. The maximum carrier concentration of $1.80{\times}10^{19}\;cm^{-3}$ and the minimum resistivity of 0.84 ${\Omega}cm$ are obtained for the AZO thin film doped with 1 mol % Al and annealed at 550 $^{\circ}C$.

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