대한전자공학회논문지SD (Journal of the Institute of Electronics Engineers of Korea SD)

대한전자공학회 (The Institute of Electronics and Information Engineers)
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내장 메모리 자가 복구를 위한 여분의 메모리 분석 알고리즘

Built-In Redundancy Analysis Algorithm for Embedded Memory Built-In Self Repair with 2-D Redundancy

  • 심은성 (숭실대학교 컴퓨터학과) ;
  • 장훈 (숭실대학교 컴퓨터학과)
  • 발행 : 2007.02.25
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⟨ 이전 논문 다음 논문 ⟩

초록

최근 VLSI 회로 직접도가 급속도로 증가함에 따라 하나의 시스템 칩에 고밀도와 고용량의 내장 메모리가 구현되고 있다. 고장난 메모리를 여분의 메모리로 재배치함으로써 메모리 수율 향상과 사용자에게 메모리를 투명하게 사용할 수 있도록 제공 할 수 있다. 본 논문에서는 고장난 메모리 부분을 여분의 행과 열 메모리 사용으로 고장난 메모리를 고장이 없는 메모리처럼 사용할 수 있도록 여분의 메모리 재배치 알고리즘을 제안하고자 한다.

With the advance of VLSI technology, the capacity and density of memories is rapidly growing. In this paper we proposed reallocation algorithm. All faulty cell of embedded memory is reallocated into the row and column spare memory. This work implements reallocation algorithm and BISR to verify its design.

키워드

참고문헌

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