The KIPS Transactions:PartD (정보처리학회논문지D)

Korea Information Processing Society (한국정보처리학회)
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An Evaluation of Software Quality Using Phase-based Defect Profile

단계기반 결점 프로파일을 이용한 소프트웨어 품질 평가

  • 이상운 (강릉대학교 컴퓨터정보공학부)
  • Published : 2008.06.30
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Abstract

A typical software development life cycle consists of a series of phases, each of which has some ability to insert and detect defects. To achieve desired quality, we should progress the defect removal with the all phases of the software development. The well-known model of phase-based defect profile is Gaffney model. This model assumes that the defect removal profile follows Rayleigh curve and uses the parameters as the phase index number. However, these is a problem that the location parameter cannot present the peak point of removed defects when you apply Gaffney model to the actual situation. Therefore, Gaffney model failed to represent the actual defect profile. This paper suggests two different models: One is modified Gaffney model that introduce the parameter of Putnam's SLIM model to replace of the location parameter, the other is the growth function model because the cumulative defect profile shows S-shaped. Suggested model is analyzed and verified by the defect profile sets that are obtained from 5 different software projects. We could see from the experiment, the suggested model performed better result than Gaffney model.

전형적인 소프트웨어 생명주기 모델은 결점이 추가되거나 제거되는 단계들의 일련의 순서로 구성되어 있다. 우리가 원하는 수준의 품질을 달성하기 위해서는 소프트웨어 개발 전 과정에서 결점 제거를 수행하여야 한다. 잘 알려진 단계기반 결점 프로파일은 Gaffney 모델이 있다. 이 모델은 결점 제거 프로파일이 Rayleigh 분포를 따르며 단계 인덱스 번호를 모수로 하고 있다. 실제 개발되는 소프트웨어에 Gaffney 모델을 적용시 제거된 결점이 최대값이 되는 점을 위치 모수가 표현하지 못하는 문제가 있다. 그러므로 Gaffney 모델은 실제 결점 프로파일을 표현하지 못한다. 본 논문은 2개의 다른 모델을 제시한다. 하나는 수정된 Gaffney 모델로 위치 모수를 교체하기 위해 Putnam의 SLIM 모델의 모수를 도입하였다. 다른 하나는 누적 결점 프로파일이 S자 형태를 보여 성장곡선 모델을 제시하였다. 제안된 모델은 5개의 다른 소프트웨어 프로젝트로부터 얻어진 결점 프로파일 분석에 의해 검증하였다. 실험 결과 제안된 모델이 Gaffney 모델 보다 좋은 결과를 얻었다.

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