Korean Journal of Materials Research (한국재료학회지)

Materials Research Society of Korea (한국재료학회)
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Defect Analysis of Phospher (Ba, Sr) FBr : Eu by X-Ray Irradiation

X선 조사에 의해 (Ba, Sr) FBr : Eu 형광 물질에 생성되는 결함 특성

  • 신중기 (한남대학교 이과대학 물리학과) ;
  • 이종용 (한남대학교 이과대학 물리학과) ;
  • 배석환 (건양대학교 병원 영상의학과) ;
  • 김재홍 (한국원자력의학원 방사선물리공학부) ;
  • 권준현 (한국원자력연구소 원자력 재료기술개발부)
  • Published : 2008.08.31
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Abstract

The mechanical property of a phosphore layer was investigated by measuring the resolution (LP/mm) and by positron annihilation spectroscopy and SEM. Image plate samples containing the phosphore layer were irradiated by X-rays in a hospital numerous times over a course of several years. The LP/mm values of a (Ba,Sr)FBr : Eu image plate irradiated by X-rays varied between 2.2 and 2.0 over a period of four years. Coincidence Doppler Broadening (CDB) positron annihilation spectroscopy was used to analyze defect structures. The S parameters of the samples from hospital use varied from 0.6219 to 0.6232. There was a positive relationship between the time of exposure to the X-rays and the S parameters. Most of the defects were found to have been generated by X-rays.

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References

  1. S. K. Ko, Medical-Radiation. Imaging & Information. Technology, p.239-276, Komoonsa, Korea, (2002)
  2. J. Miyahara, Science and Technology of Japan, 26, 28 (1985)
  3. Y. Amemiya and J. Miyahara, Nature(London), 336, 89 (1988) https://doi.org/10.1038/336089a0
  4. M. Sonoda, M. Takano, J. Miyahara, and H. Kato, Radiology, 148, 833 (1983) https://doi.org/10.1148/radiology.148.3.6878707
  5. C. Y. Lee, C. G. Kim, K. Y. Song, and J. H. Kim, Kor. J. Mater. Res., 15, 370 (2005) https://doi.org/10.3740/MRSK.2005.15.6.370
  6. C. Y. Lee, S. H. Bae, J. H. Kim, and J. H. Kwon, Kor. J. Mater. Res., 16, 455 (2006) https://doi.org/10.3740/MRSK.2006.16.7.455
  7. C. Y. Lee, J. H. Kwon, H. H. Kim, and J. M. Jeong. J. Kor. Phys. Soc., 51, 1172 (2007) https://doi.org/10.3938/jkps.51.1172
  8. C. Dietze, Th. Hangleiter, P. Willems, P. J. R. Lebians, L. Struye and J. M. Spaeth, J. Appl. Phys., 80, 1074 (1996) https://doi.org/10.1063/1.362843
  9. P. Hackenschmied, G. zeitler, M. Batentschuk, E. Hell, and W. Knupfer, Nucl. Instru. Meth. Phys. Res., 191, 163 (2002) https://doi.org/10.1016/S0168-583X(02)00544-X
  10. S. Schweizer, P. Willeme, P. J. R. Leblans, L. Struye, and J. M. Spaeth, J. Appl. Phys., 79, 4157 (1996) https://doi.org/10.1063/1.361782
  11. F. K. Koschnick, Th. Hangleiter, J. M. Spaeth, and R. S. Eachus, J. Phys. Condens. Matter, 4, 3001 (1992) https://doi.org/10.1088/0953-8984/4/11/024

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