Reduction of Temporal Image Sticking in AC Plasma Display Panels through the Use of High He Contents

  • Park, Choon-Sang (School of Electrical Engineering and Computer Science, Kyungpook National University) ;
  • Kim, Sun-Ho (School of Electrical Engineering and Computer Science, Kyungpook National University) ;
  • Kim, Jae-Hyun (School of Electrical Engineering and Computer Science, Kyungpook National University) ;
  • Tae, Heung-Sik (School of Electrical Engineering and Computer Science, Kyungpook National University)
  • Published : 2009.12.31

Abstract

The temporal dark- and bright-image sticking phenomena were examined relative to the He contents under 11% Xe content in the 50-in HD and FHD AC-PDPs with a ternary gas mixture (Xe-He-Ne). To compare the temporal dark- and bright-image sticking phenomena under various He contents, the differences in the disappearing time, display luminance, perceived luminance, infrared emission, color coordinate, color temperature, and discharge current before and after discharge were measured under 0, 35, 50, and 70% He contents. It was found that temporal dark- and bright-image sticking were reduced in proportion to the increase in He %. Thus, a high He content contributes to the reduction of temporal dark- and bright-image sticking.

Keywords

References

  1. S.-K. Kwon, J.-H. Kim, S.-K. Moon, J.-K. Choi, Y.-I. Jang, K.-H. Park, & S.-S. Han, In Proc. SID'09 Dig. (2009), p.359
  2. K.-H. Park, H.-S. Tae, H. S. Jeong, M. Hur, & E. G. Heo, J. of Soc. Information Display 17, 61 (2009) https://doi.org/10.1889/JSID17.1.61
  3. H.-S. Tae, C.-S. Park, B.-G. Cho, J.-W. Han, B. J. Shin, S.-I. Chein, & D. H. Lee, IEEE Trans. Plasma Sci. 34, 996 (2006) https://doi.org/10.1109/TPS.2006.875828
  4. J. H. Kim, C.-S. Park, B.-S. Kim, K.-H. Park, & H.-S. Tae, Journal of Information Display 8, 29 (2007) https://doi.org/10.1080/15980316.2007.9652036
  5. C.-S. Park, B.-G. Cho, & H.-S. Tae, Journal of Information Display 9, 39 (2008) https://doi.org/10.1080/15980316.2008.9652069
  6. C.-S. Park & H.-S. Tae, IEICE Trans. Elec. E-92C, 161 (2009)
  7. B. J. Shin, K. C. Choi, & J. H. Seo, IEEE Trans. on Elec. Dev. 52, 17 (2005) https://doi.org/10.1109/TED.2004.841352
  8. S. H. Kim, K. C. Choi, & B. J. Shin, In Proc. IDW'05 Dig. (2005), p.1555
  9. H.-J. Lee, D.-H. Kim, Y.-R. Kim, M.-S. Hahm, D.-K. Lee, J.-Y. Choi, C.-H. Park, J.-W. Rhyu, J.-K. Kim, & S.-G. Lee, In Proc. SID'04 Dig. (2004), p.214
  10. J. H. Choi, Y. Jung, K. B. Jung, S. B. Kim, P. Y. Oh, H. S. Jung, K. Y. Sung, & E. H. Choi, In Proc. IDW'03 Dig. (2003), p.913
  11. M. J. Jeon, M. S. Chung, S. C. Lee, K. S. Lee, J. S. Kim, & B. K. Kang, Displays 30, 39 (2009) https://doi.org/10.1016/j.displa.2008.10.003
  12. K.-H. Park, H.-S. Tae, H. S. Jeong, M. Hur, & E. G. Heo, IEEE Trans. on Plas. Sci. 17, 61 (2009)