Korean Journal of Materials Research (한국재료학회지)

Materials Research Society of Korea (한국재료학회)
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Electrical and Optical Property of Single-Wall Carbon Nanotubes Films

단일벽 탄소나노튜브 필름의 전기적 및 광학적 특성

  • Oh, Dong-Hoon (Department of Materials Science and Engineering, Chungnam National University) ;
  • Kang, Young-Jin (Department of Materials Science and Engineering, Chungnam National University) ;
  • Jung, Hyuck (Department of Materials Science and Engineering, Chungnam National University) ;
  • Song, Hye-Jin (Department of Materials Science and Engineering, Chungnam National University) ;
  • Cho, You-Suk (Department of Materials Science and Engineering, Chungnam National University) ;
  • Kim, Do-Jin (Department of Materials Science and Engineering, Chungnam National University)
  • 오동훈 (충남대학교 공과대학 재료공학과 나노 재료 응용 실험실) ;
  • 강영진 (충남대학교 공과대학 재료공학과 나노 재료 응용 실험실) ;
  • 정혁 (충남대학교 공과대학 재료공학과 나노 재료 응용 실험실) ;
  • 송혜진 (충남대학교 공과대학 재료공학과 나노 재료 응용 실험실) ;
  • 조유석 (충남대학교 공과대학 재료공학과 나노 재료 응용 실험실) ;
  • 김도진 (충남대학교 공과대학 재료공학과 나노 재료 응용 실험실)
  • Published : 2009.09.27
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Abstract

Thin films of single-wall carbon nanotubes (SWNT) with various thicknesses were fabricated, and their optical and electrical properties were investigated. The SWNTs of various thicknesses were directly coated in the arc-discharge chamber during the synthesis and then thermally and chemically purified. The crystalline quality of the SWNTs was improved by the purification processes as determined by Raman spectroscopy measurements. The resistance of the film is the lowest for the chemically purified SWNTs. The resistance vs. thickness measurements reveal the percolation thickness of the SWNT film to be $\sim$50 nm. Optical absorption coefficient due to Beer-Lambert is estimated to be $7.1{\times}10^{-2}nm^{-1}$. The film thickness for 80% transparency is about 32 nm, and the sheet resistance is 242$\Omega$/sq. The authors also confirmed the relation between electrical conductance and optical conductance with very good reliability by measuring the resistance and transparency measurements.

Keywords

References

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