Sn-xAg-0.5Cu 무연 솔더의 파손특성에 관한 실험적 연구

An Experimental Study on the Failure Characteristics of Sn-xAg-0.5Cu Lead-free Solder

  • 정종설 (서울산업대 NID 융합기술전문대학원) ;
  • 이용성 (서울산업대 NID 융합기술전문대학원) ;
  • 신기훈 (서울산업대 기계공학과) ;
  • 정성균 (서울산업대 기계공학과) ;
  • 김종형 (서울산업대 기계설계자동화공학부) ;
  • 장동영 (서울산업대 산업정보시스템공학과)
  • 발행 : 2009.10.15

초록

This paper presents an experimental study on the failure characteristics of SnAgCu lead-free solder balls. To estimate the effect of Ag, three types of SnAgCu balls are first prepared by varying the weight percent of Ag(1.0, 3.0, 4.0 wt%) and then analyzed by reliability tests such as thermal shock, high speed ball shear, and drop tests. Thermal shock test reveals that the higher the weight percent of Ag is, the longer the fatigue lift becomes. To the contrary, high speed ball-shear test and drop test show that the shear strength and the fracture toughness of solder balls are inversely proportional to the weight percent of Ag, respectively, Reasons for these observations will be further investigated In the future work.

키워드

참고문헌

  1. European Union Directive, 2003, Restriction of the use of certain hazardous substances in electrical and electronic equipment(RoHS), DIRECTIVE 2002/95/EC, EUROPEAN PARLIAMENT AND COUNCIL.
  2. European Union Directive, 2003, Waste electrical and electronic equipment (WEEE), DIRECTIVE 2002/96/EC, EUROPEAN PARLIAMENT AND COUNCIL.
  3. Nah, J. W., Kim, J. H., Lee, H. M., and Paik, K. W., 2004, "Electromigraion in flip chip solder bump of 97PB-3Sn/37Pb-63Sn combination structure," Acta Materialia, Vol. 52, pp. 129-136.
  4. Jang, S. Y., Wolf, J, Kwon, W. S., and Paik, K. W., 2002, "UBM(Under Bump Metallization) Study for Pb-free ElectroplatilecBumpile:b-nterfcBe Reaction and Electromigration," 2002 Electronic Components and Technology Conference.
  5. Shed, A., 2004, "Accumulated creep strain and energy density based thermal fatigue life prediction models for SnAgCu solder joint," 54th ECTC, Las Vegas, Nevada, USA, pp. 737-746.
  6. She, A., 2001, "Predicting Solder Joint Reliability for Thermal, Power, and Bend Cycle within 25% Accuracy," 2001 Electronic Components and Technology Conference, pp. 255-263.
  7. Hossain, M. and Agonafer, D., 2004, "Strain based Approach for Predicting the Solder Joint Fatigue Life with the Addition of Intermetallic Compound using Finite Element Modeling," 2004 International Society Conference on Thermal Phenomena, pp. 358-367.
  8. Darveaux, R., 1997, "Solder Joint Fatigue Life Model, in Design and Reliability of Solders and Solder Interconnections," Miner. Meta. Mater. Soc., pp. 213-218.
  9. Shin, K. H., Kim, H. T., and Jang, D. Y., 2007, "An Analysis on the Thermal Shock Characteristics of Pb-free Solder Joints and UBM in Flip Chip Packages," Transactions of KSMTE, Vol. 16, No. 5.
  10. JEDEC, 2004, Thermal Shock, JESD22-A106B, Joint Electron Device Engineering Council, VA, USA.
  11. JEDEC, 2000, Solder Ball Shear, JESD22-B117A, Joint Electron Device Engineering Council, VA, USA.
  12. JEDEC, 2006, Board Level Drop Test Method of Components for Handheld Electronic Products, JESD22-B111, Joint Electron Device Engineering Council, VA, USA.