전자파 보안 기술 동향

  • 정연춘 (서경대학교 전자공학과)
  • 발행 : 2010.01.31

초록

키워드

참고문헌

  1. Report of the Commission to Asses the Threat to the United States form Electromagnetic Pulse (EMP) Attack, 2004.
  2. Report of the Commission on Critical National Infrastructures, 2008.
  3. Kimihiro Tajima, Yoshiharu Akiyama, Tetsuya Tominaga, and Tadahito Aoki, "Acitivities for information security against electromagnetic radiation from telecommunication facilities", NTT Technical Review, vol. 6, no. 10, pp 1-5, Oct. 2008.
  4. Hidenori Sekiguchi, Shinji Seto, "Measurement system of information signal in display image leaking from conducted emission on power leads of a personal computer", Proc. of 2009 lnt'l Symp. on EMC, pp. 5-8, JuI. 2009.
  5. Yasunao Suzuki, Masao Masugi, Hiroshi Yamane and Kimihiro Tajima, "Countermeasure technique for preventing information leakage caused by unintentional PC display emanations", Proc. of 2009 Int'l Symp. on EMC, pp. 9-12, Jul. 2009.
  6. lEC 61000-1-5, Electromagnetic Compatibility (EMC)-Part 1-5: General-High power electromagnetic (HPEM) effects on civil systems, 2004.
  7. Vladimir M. Loborev, "Up to date state of the nemp problems and topical research directions", Proceeding of the European Electromagnetics International Symposium-EUROEM 94, pp. 15-21, Jun. 1994.
  8. Jena B. McNeil, R. Weitz, "Electromagnetic Pulse (EMP) Attack: A Preventable Homeland Security Catastrophe", No. 2199, The Heritage Foundation, Oct. 2008.
  9. Draft text of Recommendation K.hpem: Application of requirements against HPEM to telecommunication systems", International Telecommunication Union-Telecommunication Standardization Sector (ITU-T), Geneva, Switzerland, 2008.
  10. MIL-STD-461F, "Requirements for the control of electromagnetic interference characteristics of subsystems and equipment", Dec. 2007.
  11. MIL-STD-464A, "Electromagnetic environmental effects requirements for systems", Dec. 2007.
  12. D. Nitch, M. Camp, F. Sabath, J. ter Haseborg, and H. Garbe, "Susceptibility of some electronic equipment to HPEM threats", IEEE Trans. on EMC, vol. 46, no. 3, pp. 380-389.
  13. M. Backstrom, K. Lovstrand, "Susceptibility of electronic systems to high-power microwaves: Summary of test experience", IEEE Trans. on EMC, vol. 46, no. 3, pp. 396-403.
  14. R. Hoad, Nigel J. Carter, D. Herke, and Stephen P. Watkins, "Trends in EM susceptibility of IT equipment", IEEE Trans. on EMC, vol. 46, no. 3, pp. 390-395.