Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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A 10b 100MS/s 0.13um CMOS D/A Converter Based on A Segmented Local Matching Technique

세그먼트 부분 정합 기법 기반의 10비트 100MS/s 0.13um CMOS D/A 변환기 설계

  • Received : 2010.01.11
  • Accepted : 2010.02.05
  • Published : 2010.04.25
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Abstract

This work proposes a 10b 100MS/s DAC based on a segmented local matching technique primarily for small chip area. The proposed DAC employing a segmented current-steering structure shows the required high linearity even with the small number of devices and demonstrates a fast settling behavior at resistive loads. The proposed segmented local matching technique reduces the number of current cells to be matched and the size of MOS transistors while a double-cascode topology of current cells achieves a high output impedance even with minimum sized devices. The prototype DAC implemented in a 0.13um CMOS technology occupies a die area of $0.13mm^2$ and drives a $50{\Omega}$ load resistor with a full-scale single output voltage of $1.0V_{p-p}$ at a 3.3V power supply. The measured DNL and INL are within 0.73LSB and 0.76LSB, respectively. The maximum measured SFDR is 58.6dB at a 100MS/s conversion rate.

본 논문에서는 주로 소면적 구현을 위하여 세그먼트 부분 정합 기법을 적용한 10비트 100MS/s DAC를 제안한다. 제안하는 DAC는 비교적 적은 수의 소자로도 요구되는 선형성을 유지하면서 고속으로 부하저항의 구동이 가능한 세그먼트 전류 구동방식 구조를 사용하였으며, 제안하는 세그먼트 부분 정합 기법을 적용하여 정합이 필요한 전류 셀들의 숫자와 크기를 줄였다. 또한, 전류 셀에는 작은 크기의 소자를 사용하면서도 높은 출력 임피던스를 얻을 수 있도록 이중-캐스코드 구조를 채용하였다. 시제품 DAC는 0.13um CMOS 공정으로 제작되었으며, 유효 면적의 크기는 $0.13mm^2$이다. 시제품 측정 결과, 3.3V의 전원전압과 $1V_{p-p}$의 단일 출력 범위 조건에서 $50{\Omega}$의 부하저항을 구동할 때 DNL 및 INL은 각각 -0.73LSB, -0.76LSB 수준이며, SFDR은 100MS/s의 동작 속도에서 최대 58.6dB이다.

Keywords

References

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