Abstract
Generally, the digital circuit card can be tested by automatic test equipment using LASAR(Logic Automated Stimulus and Response). This paper proposes the ROM data extracting algorithm which can test the digital circuit card that consists usually ROMs. We are implemented of the proposed fault detecting program by LabWindow/CVI 8.5 and the digital automatic test instrument with NI-VXI(National Instrument - Versa Bus Modular Europe eXtentions for Instrumentation) card. We also make an interface circuit board connecting the digital test instrument and the digital circuit card. It shows the good performance of getting the data from ROMs.
