Journal of the Korea Institute of Information and Communication Engineering (한국정보통신학회논문지)

The Korea Institute of Information and Commucation Engineering (한국정보통신학회)
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Measurement of the planar substrate dielectric constant using a microstrip line

마이크로스트립 선로를 이용한 기판의 유전율 측정

  • Received : 2010.12.14
  • Accepted : 2010.12.23
  • Published : 2011.01.31
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Abstract

This paper suggested the fast and easy method of the dielectric constant measurement for planar dielectrics using a microstrip line. The complex permittivity and permeability were presented by the first reflection and transmission coefficient which were derived from the scattering parameters. This method was verified by the measurement of a known planar dielectric using a microstrip line. This method can be applied to the dielectric constant measurement of unknown planar dielectric.

마이크로스트립 선로를 이용하여 기판의 유전율을 광대역에서 빠르고 쉽게 측정하는 방법을 제시하였다. 산란계수를 이용하여 1차 반사계수와 1차 전송계수를 구하여 기판의 복소 유전율과 복소 투자율을 계산하는 과정을 보였다. 기존에 유전율을 알고 있는 기판에 제작한 마이크로스트립 라인의 산란계수를 회로망분석기를 이용하여 측정하여 기판유전율을 확인하였다. 이 방법은 유전율을 모르는 기판의 유전율을 측정하는데 적용가능하다.

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References

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