한국방사선학회논문지 (Journal of the Korean Society of Radiology)

  • 제6권6호
  • /
  • Pages.477-481
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  • 2012
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  • 1976-0620(pISSN)
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  • 2384-0633(eISSN)
한국방사선학회 (The Korean Society of Radiology)
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엑스선용 평행빔 광학소자 개발 및 평가

Development and Evaluation of Parallel Beam Optic for X-ray

  • 박병훈 (대구가톨릭대학교 방사선학과) ;
  • 조형욱 (대구가톨릭대학교 방사선학과) ;
  • 천권수 (대구가톨릭대학교 방사선학과)
  • Park, Byunghun (Department of Radiological Science, Catholic University of Daegu) ;
  • Cho, Hyungwook (Department of Radiological Science, Catholic University of Daegu) ;
  • Chon, Kwonsu (Department of Radiological Science, Catholic University of Daegu)
  • 투고 : 2012.10.17
  • 심사 : 2012.12.21
  • 발행 : 2012.12.30
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초록

엑스선 회절분석기는 비파괴적인 방법으로 시료의 정보를 정성 및 정량적으로 분석할 수 있다. 엑스선 회절분석기에는 다양한 광학소자가 사용된다. 평행빔 광학소자는 광축에 평행한 빔을 통과시키고 발산하는 빔을 제거하는 역할을 한다. 와이어 컷 제작과 스테인리스 스틸 평판을 연마하여 평행빔 광학소자를 제작하였고 엑스선 영상장치를 이용하여 그 평행도를 평가하였다. 설계된 6 mrad과 매우 가까운 6.6 mrad의 평행도를 갖는 평행빔 광학소자를 제작하였다. 엑스선 영상을 이용하면 개개의 평판의 평행도를 예측할 수 있을 뿐만 아니라 다양한 광학소자 평가에도 사용될 수 있을 것이다.

An X-ray diffractometer which has various X-ray optics can give qualitative and quantitative information for a sample using a nondestructive analysis method. A parallel beam optic passes the parallel beam and removes divergent beam generated from an X-ray tube. The parallel beam optic used in the X-ray diffractometer was fabricated by wire cut and grading of stainless steel plates and was evaluated its performance using an X-ray imaging system. The measured parallelization of 6.6 mrad for the fabricated the parallel beam optic was a very close to the expected value of 6 mrad. An X-ray imaging technique for evaluating the parallel beam optics can estimate parallelization for each plate and can be used to other X-ray optics.

키워드

참고문헌

  1. B. E. Warren, X-ray Diffraction, Dover publications, New York, 1990.
  2. B. D. Cullity, S. R. Stock, Elements of X-ray diffraction, Prentice-Hall, New Jersey, 2001
  3. D. M. Moore, R. C. Reynolds, Jr, X-ray diffraction and the identification and analysis of clay minerals, Oxford University Press, 1997.
  4. B. Beckhoff, B. Kanngieber, N. Langhoff, R. Wedell, H. Wolff (Eds.), Handbook of Practical X-Ray Fluorescence Analysis, Springer, Berlin, 2005.
  5. U. Pietsch, V. Holy, T. Baumbach, High-Resolution X-Ray Scattering, Springer, New York, 2003
  6. K. Barla, R. Herino, G. Bomchil, J. C. Pfister, A. Freund, "Determination of lattice parameter and elastic properties of porous silicon by X-ray diffraction", Journal of Crystal Growth, Vol. 68, No. 3, pp.727-732, 1984. https://doi.org/10.1016/0022-0248(84)90111-8
  7. A. Kazimirov, J. Zegenhagen, M. Cardona, "Isotopic Mass and Lattice Constant : X-ray Standing Wave Measurements", science, Vol. 282, No. 5390, pp.930-932, 1998. https://doi.org/10.1126/science.282.5390.930
  8. L. Lu, V. Sahajwalla, C. Kong, D. Harris, "Quantitative X-ray diffraction analysis and its application to various coals", Carbon, Vol. 39, No.12, pp.1821-1833, 2001. https://doi.org/10.1016/S0008-6223(00)00318-3
  9. L. E. Copeland, R. H. Bragg, "Quantitative X-ray diffraction analysis", Analytical Chemistry, Vol. 30, No. 2, pp.196-201, 1958. https://doi.org/10.1021/ac60134a011
  10. L. D. Whittig, W. R. Allardice, A. Klute, "X-ray diffraction techniques", Methods of soil analysis, pp.331-362, 1986.
  11. E. Spiller, Soft X-ray optics, SPIE-International Society for Optical Engineering, 1994.
  12. J. V. Gilfrich, el al (Eds.), Advances in X-ray Analysis, Vol. 39, Springer, 1997.