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A Nuclear Event Detectors Fabrication and Verification for Detection of a Transient Radiation

과도방사선 검출을 위한 핵폭발 검출기 제작 및 검증

  • Jeong, Sang-Hun (Dept. of Electronic Engineering, Chonbuk National University, Dept. of Nuclear Convergence Technology Development Korea Atomic Energy Research Institute) ;
  • Lee, Seung-Min (Dept., of Electric, Electronics & Communication Engineering Education, Chungnam National University) ;
  • Lee, Nam-Ho (Dept. of Nuclear Convergence Technology Development Korea Atomic Energy Research Institute) ;
  • Kim, Ha-Chul (Dept. Electrical Engineering, Republic of Korea Naval Academy) ;
  • Cho, Seong-Ik (Dept. of Electronic Engineering, Chonbuk National University)
  • 정상훈 (전북대학교 전자정보공학부) ;
  • 이승민 (충남대학교 사범대학 전기전자통신공학교육과) ;
  • 이남호 (한국원자력연구원 융합기술개발부) ;
  • 김하철 (해군사관학교 전기전자공학과) ;
  • 조성익 (전북대학교 전자공학부)
  • Received : 2013.01.15
  • Accepted : 2013.04.16
  • Published : 2013.05.01

Abstract

In this paper, proposed NED(nuclear event detectors) for detection of a transient radiation. Nuclear event detector was blocked of power temporary for defence of critical damage at a electric device when a induced transient radiation. Conventional NED consist of BJT, resistors and capacitors. The NED supply voltage of 5V and MCM(Multi Chip Module) structures. The proposed NED were designed for low supply voltage using 0.18um CMOS process. The response time of proposed NED was 34.8ns. In addition, pulse radiation experiments using a electron beam accelerator, the output signal has occurred.

Keywords

References

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