Journal of Magnetics

The Korean Magnetics Society (한국자기학회)
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Polarization State of Scattered Light in Apertureless Reflection-mode Scanning Near-Field Optical Microscopy

  • Cai, Yongfu (Department of Materials Science and Technology, Nagaoka University of Technology) ;
  • Aoyagi, Mitsuharu (Department of Materials Science and Technology, Nagaoka University of Technology) ;
  • Emoto, Akira (National Institute of Advanced Industrial Science and Technology (AIST)) ;
  • Shioda, Tatsutoshi (Department of Electrical Engineering, Nagaoka University of Technology) ;
  • Ishibashi, Takayuki (Department of Materials Science and Technology, Nagaoka University of Technology)
  • Received : 2012.05.31
  • Accepted : 2012.12.04
  • Published : 2013.09.30
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Abstract

We studied the polarization state in an apertureless scanning near-field microscopy (a-SNOM) operating in reflection mode by using three-dimensional Finite-difference Time-domain (FDTD) method. As a result, the electric field around tip apex in the near-field region enhanced four times stronger than the incident light for ppolarization when the tip-sample separation was 10 nm. We find that the p- and s-polarization state is maintained for the scattered light when the probe is perpendicular to the sample. When the probe is not perpendicular to the sample, the polarization state of scattered light will rotate an angle that equals to the inclination angle of probe with p-polarization illumination. On the other hand, the polarization state will not rotate with s-polarization illumination.

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References

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Cited by

  1. Polarization Properties in Apertureless-Type Scanning Near-Field Optical Microscopy vol.10, pp.1, 2015, https://doi.org/10.1186/s11671-015-1062-5
  2. Prototype of Atomic Force Microscope with High Resolution Optical Microscope for Observing Magnetic Nanodot Arrays vol.643, pp.1662-9795, 2015, https://doi.org/10.4028/www.scientific.net/KEM.643.185