DOI QR코드

DOI QR Code

Fabrication of Hydrophobic Anti-Reflection Coating Film by Using Sol-gel Method

Sol-gel 법을 이용한 내오염 반사방지 코팅막 제조

  • Kim, Jung-Yup (Korea Institute of Ceramic Engineering and Technology, Optic & Display Materials Team) ;
  • Lee, Ji-Sun (Korea Institute of Ceramic Engineering and Technology, Optic & Display Materials Team) ;
  • Hwang, Jonghee (Korea Institute of Ceramic Engineering and Technology, Optic & Display Materials Team) ;
  • Lim, Tae-Young (Korea Institute of Ceramic Engineering and Technology, Optic & Display Materials Team) ;
  • Lee, Mi-Jai (Korea Institute of Ceramic Engineering and Technology, Optic & Display Materials Team) ;
  • Hyun, Soong-Keun (Department of Materials Science and Engineering, Inha University) ;
  • Kim, Jin-Ho (Korea Institute of Ceramic Engineering and Technology, Optic & Display Materials Team)
  • 김정엽 (한국세라믹기술원 광.디스플레이소재팀) ;
  • 이지선 (한국세라믹기술원 광.디스플레이소재팀) ;
  • 황종희 (한국세라믹기술원 광.디스플레이소재팀) ;
  • 임태영 (한국세라믹기술원 광.디스플레이소재팀) ;
  • 이미재 (한국세라믹기술원 광.디스플레이소재팀) ;
  • 현승균 (인하대학교 금속공학과) ;
  • 김진호 (한국세라믹기술원 광.디스플레이소재팀)
  • Received : 2014.09.29
  • Accepted : 2014.11.21
  • Published : 2014.12.27

Abstract

Anti-reflection coating films have used to increase the transmittance of displays and enhance the efficiency of solar cells. Hydrophobic anti-reflection coating films were fabricated on a glass substrate by sol-gel method. To fabricate an anti-reflection film with a high transmittance, poly ethylene glycol (PEG) was added to tetraethyl orthosilicate (TEOS) solution. The content of PEG was changed from 1 to 4 wt% in order to control the morphology, thickness, and refractive index of the $SiO_2$ thin films. The reflectance and transmittance of both sides of the coated thin film fabricated with PEG 4 wt% solution were 0.3% and 99.4% at 500 nm wavelength. The refractive index and thickness of the thin film were n = 1.29 and d = 105 nm. Fluoro alkyl silane (FAS) was used for hydrophobic treatment on the surface of the anti-reflection thin film. The contact angle was increased from $13.2^{\circ}$ to $113.7^{\circ}$ after hydrophobic treatment.

Keywords

References

  1. K. W. Boer, Advances in Solar Energy, Plenum Press, New York, (1986).
  2. D. Bouhafs, A. Moussi, A. Chikouche, J. M. Ruiz, Sol. Energy Mater. Solar Cells, 52, 79 (1998). https://doi.org/10.1016/S0927-0248(97)00273-0
  3. A. Combert, W. Glaubitt, K. Rose, J. Dreibholz, B. Blasi, A. Heinzel, D. Sporn, W. Doll, V. Witter, Solar Cells, 63, 357 (2000).
  4. M. C. Bautista, A. Morales, Sol. Energy Mater. Solar Cells, 80, 217 (2003). https://doi.org/10.1016/j.solmat.2003.06.004
  5. Brinker, C. J. Scherer, G. W. Sol-Gel Science; Academic Press: Lodon, (1990).
  6. P. Chrysicopoulou, D. Davazoglou, Chr. Trapalis and G. Kordas, Thin Solid Films, 323, 188 (1998). https://doi.org/10.1016/S0040-6090(97)01018-3
  7. M. Takeuchi, T. Itoh and H. Nagasaka, Thin Solids Films, 51, 83 (1978). https://doi.org/10.1016/0040-6090(78)90215-8
  8. K. S. Yeung and Y. W. Lam, Thin Solids Films, 109, 169 (1983). https://doi.org/10.1016/0040-6090(83)90136-0
  9. J. H. Kim and S. Shiratori. J. Appl. Phys., 44, 7588 (2005). https://doi.org/10.1143/JJAP.44.7588
  10. Y. Tsuge, J. H. Kim, Y. Sone, O. Kuwaki and S. Shiratori, Thin Solid Films, 516, 2463 (2008). https://doi.org/10.1016/j.tsf.2007.04.084
  11. H. J. Kim, K. J. Jeong and D. S. Bae. J. Mater. Res., 22(5), 249 (2012).
  12. G. Decher, J. D. Hong and J. Schmitt, Thin Soild Films, 831, 210 (1992).
  13. B. A. Moys, Thin Solid Films 21, 145 (1974). https://doi.org/10.1016/0040-6090(74)90097-2
  14. C. Martinet, V. Paillard, A. Gagnaire, J. Joseph, J. Non-Cryst. Solids, 216, 77 (1997). https://doi.org/10.1016/S0022-3093(97)00175-0
  15. H. J. Hovel, Solar Cells, Semiconductor and Semimetals, 11, Academic Press, New York, (1975).
  16. J. Zhao, M. A. Green, IEEE Trans. Electron Dev. 38, 1925 (1991). https://doi.org/10.1109/16.119035
  17. H. A. Macleod, Adam Hilger, Macmillan, Bristol, New York, (1986).
  18. V. Purcar, I. Stamatin, O. Cinteza, C. Petcu, V. Raditoiu, M. Ghiurea, T. Miclaus, A. Andronie, Surface Coatings Technol., 206, 4449 (2012). https://doi.org/10.1016/j.surfcoat.2012.04.094
  19. J. Y. Kim, J. H. Wang, T. Y. Lim, M. J. Lee, S. K. Hyun and J. H. Kim (in Korean), J. Photon. Sci. Technol., 3, 65 (2013).