Analysis of reliability test results of low-pass filter assembly

저역필터 어셈블리에 대한 신뢰성시험 결과의 해석

  • Baik, Jaiwook (Department of Information Statistics, Korea National Open University)
  • 백재욱 (한국방송통신대학교 정보통계학과)
  • Received : 2014.01.10
  • Accepted : 2014.03.14
  • Published : 2014.03.25

Abstract

Thermal shock tests at two stress levels were performed to see the life (cycles) of LPF ASSY (low pass filter assembly) at normal stress level. In this case Coffin-Manson relationship is generally used to describe the relationship between the temperature difference and the life, together with the Weibull distribution describing the life at each stress level. So for given data Coffin-Manson is fitted to predict the life at normal stress level. However, different types of models are appropriate for this type of test. Hence, a more appropriate model such as General log-linear model which can also incorporate the duration at the highest and lowest temperatures and acceleration time will be introduced.

Keywords

References

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