Journal of the Optical Society of Korea

Optical Society of Korea (한국광학회)
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Parametrization of the Optical Constants of AlAsxSb1-x Alloys in the Range 0.74-6.0 eV

  • Kim, Tae Jung (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University) ;
  • Byun, Jun Seok (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University) ;
  • Barange, Nilesh (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University) ;
  • Park, Han Gyeol (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University) ;
  • Kang, Yu Ri (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University) ;
  • Park, Jae Chan (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University) ;
  • Kim, Young Dong (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University)
  • Received : 2014.07.08
  • Accepted : 2014.07.28
  • Published : 2014.08.25
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Abstract

We report parameters that allow the dielectric functions ${\varepsilon}={\varepsilon}_1+i{\varepsilon}_2$ of $AlAs_xSb_{1-x}$ alloys to be calculated analytically over the entire composition range $0{\leq}x{\leq}1$ in the spectral energy range from 0.74 to 6.0 eV by using the dielectric function parametric model (DFPM). The ${\varepsilon}$ spectra were obtained previously by spectroscopic ellipsometry for x = 0, 0.119, 0.288, 0.681, 0.829, and 1. The ${\varepsilon}$ data are successfully reconstructed and parameterized by six polynomials in excellent agreement with the data. We can determine ${\varepsilon}$ as a continuous function of As composition and energy over the ranges given above, and ${\varepsilon}$ can be converted to complex refractive indices using a simple relationship. We expect these results to be useful for the design of optoelectronic devices and also for in situ monitoring of AlAsSb film growth.

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References

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