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Three level constant stress accelerated life tests for Weibull distribution

  • Moon, Gyoung Ae (Devision of Oriental Medicine and Processing, Hanzhong University)
  • Received : 2014.12.17
  • Accepted : 2015.01.12
  • Published : 2015.01.31

Abstract

In this paper, the maximum likelihood estimators and confidence intervals for parameters of Weibull distribution are derived under three level constant stress accelerated life tests and the assumption that a log quadratic relationship exits between stress and the scale parameter ${\theta}$. The compound linear plan proposed by Kim (2006) is used to allocate the test units at each stress level, which performed nearly as good as the optimum quadratic plan and had the advantage of simplicity. Some simulation studies are given.

Keywords

References

  1. Bai, D. and Chung, S. (1992). Optimal design of partially accelerated life-test for exponential distribution under Type-I censoring. IEEE Transactions on Reliability, 41, 400-406. https://doi.org/10.1109/24.159807
  2. Khamis, I. H. (1997a). Comparison between constant and step-stress tests for Weibull models. International Journal of Quality & Reliability Management, 14, 74-81. https://doi.org/10.1108/02656719710156798
  3. Khamis, I. H. (1997b). Optimum M-step. step-stress design with k stress variables. Communications in Statistics, Computation and Simulation, 26, 1301-1313. https://doi.org/10.1080/03610919708813441
  4. Khamis, I. H. and Higgins, J. J. (1996). Optimum 3-step step-stress tests. IEEE Transactions on Reliability, 45, 341-345. https://doi.org/10.1109/24.510823
  5. Kim, I. H. (2006). Compound linear test plan for 3-level constant stress tests. Journal of Korean Data & Information Science Society, 17, 945-952.
  6. Meeker, W. Q. (1984). A comparison of accelerated life test plans for Weibull and lognormal distributions and Type I censoring. Technometrics, 26, 157-171. https://doi.org/10.1080/00401706.1984.10487941
  7. Meeker, W. Q. and Nelson, W. (1975). Optimum accelerated life tests for the Weibull and extreme value distribution. IEEE Transactions on Reliability, 24, 321-332.
  8. Moon, G. A. (2008). Step-stress accelerated life test for grouped and censored data. Journal of Korean Data & Information Science Society, 19, 697-708.
  9. Moon, G. A. (2012). Optimal three step stress accelerated life tests under periodic inspection and type I censoring. Journal of the Korean Data & Information Science Society, 23, 843-850. https://doi.org/10.7465/jkdi.2012.23.4.843
  10. Moon, G. A. and Kim, I. H. (2006). Parameter estimation of the two-parameter exponential distribution under three step-stress accelerated life test. Journal of Korean Data & Information Science Society, 17, 1375-1386.
  11. Moon, G. A. and Park, Y. K. (2009). Optimal step stress accelerated life tests for the exponential distribution under periodic inspection and type I censoring. Journal of the Korean Data & Information Science Society, 20, 1169-1175.