DOI QR코드

DOI QR Code

The Acclerated Life Test of Hard Disk In The Environment of PACS

PACS 환경에서 하드디스크의 가속 수명시험

  • Cho, Euy-Hyun (Yeungnam University Dept.of Biomedical Engineering) ;
  • Park, Jeong-Kyu (Daegu Health College Dept.of Radiologic Technology) ;
  • Chae, Jong-Gyu (Yeungnam University Dept.of Digital Convergence Business)
  • Received : 2015.01.01
  • Accepted : 2015.02.27
  • Published : 2015.02.28

Abstract

In this paper, we estimate the life cycle from acceleration life test about the hard disk of disk array of image storage of PACS. Webuil distribution was selected by the Anderson-Darling goodness-of-fit test with data of down time at $50^{\circ}C$ and $60^{\circ}C$. The equality test of shape parameter and scale parameter was conducted, so that the probability distribution estimated from data of down time at $50^{\circ}C$ and $60^{\circ}C$ was not statistically significant. The shape parameter was 1.0409, The characteristic life was 24603.5 hours at normal user condition($30^{\circ}C$) by the analysis of weibull-arrhenius modeling which included the acceleration factor of temperature, and The activation energy was 0.5011 eV through arrhenius modeling. The failure analysis of the failure samples of acceleration test and the samples of market return was conducted, so that the share percentage of failure mode was detail difference but the rank of share percentage was almost same. This study suggest the test procedure of acceleration test of hard disk drive in PACS using environment, and help the life estimation at manufacture and use.

본 연구는 PACS의 영상저장부의 디스크 배열에 들어가는 하드디스크의 수명을 제조회사의 가속 수명시험 결과로 예측하고자 하였다. $50^{\circ}C$, $60^{\circ}C$의 고장시간 데이터로 Anderson-Darling 적합도 검증을 진행하여 와이블 분포를 채택하였다. 형상모수와 척도모수로 동일성 검증을 진행한 결과, 가속 수명 시험 $50^{\circ}C$ 조건과 가속 수명 시험 $60^{\circ}C$ 조건의 확률분포가 통계적으로 유의하지 않았다. 온도 가속인자를 포함한 와이블-아레니우스 모형으로부터 추정한 형상모수는 1.0409이며, 사용조건($30^{\circ}C$)의 특성수명은 24603.5 시간이었다. 또한 아레니우스 모델 식에 반영하여 활성화 에너지 0.5011 eV을 산출하였다. 그리고 가속시험의 정확성 확보차원에서 가속시험 불량시료와 시장 반품 시료로 고장 분석을 진행한 결과, 불량 모드별 점유율의 세부 차이는 있으나, 점유율 순서는 일치 하였다. 본 연구는 PACS 환경 하에서 하드디스크의 가속시험절차를 제안하며, 제조자와 사용자간에 수명예측에 도움을 주고자 한다.

Keywords

References

  1. Elerath JG. Enhanced reliability modeling of RAID storage systems. dependable systems and networks. 37th annual institute of electrical and electronics engineers/international federation for information processing, international conference, pp 175-184, 2007.
  2. Schroeder B, Gibson GA: Disk failures on thr real world: What does an MTTF of 1000000 hours mean to you ?. ACM Trans Storage 3(: 1-16, 2007. https://doi.org/10.1145/1227835.1227836
  3. Euy-Hyun Cho, Jeong-kyu Park, Hui-Don Seo: The Accelerated Life Test of 2.5 Inch Hard DiskIn The Environment of PC using Journal of Digital Contents Society Vol. 15 No. 1 pp. 19-27,2014 https://doi.org/10.9728/dcs.2014.15.1.19
  4. Shaohsin Chen, Feng-Bin Sun, Yang, J, "A New Method of Hard Disk Drive MTTF Projection Using Data from an Early Life Test", Reliability and Maintainability Symposium, Proceedings. Annual Vol.18, No. 21,pp. 252-257, Jan. 1999.
  5. Kim BN, Kim JJ, Jang SW, Shin SJ, Gwak GD: Accelerated life test for LED. The Korean society of mechanical engineers proceedings autumnal symposium, 2006.
  6. Strom BD, Lee SC, Tyndall GW: Hard disk drive reliability modeling and failure prediction institute of electrical and electronics engineers transaction on magnetics, 43(9): 3676-84, 2007.
  7. Seo SG: Minitab reliability analysis. Eretec: Gyunggi, 2009, pp 113,119-124, pp 310-323.
  8. Kang BS, Kim HU, Jang MS, Song CS: A study on validation of accelerated model for pneumatic cylinder. The Korean society of mechanical engineers 33(10): 1139-1143, 2009. https://doi.org/10.3795/KSME-A.2009.33.10.1139
  9. McPherson JW: Reliability physics and engineering, Springer. pp 37-116, 2011.
  10. Kim JJ, Chang SW, Son YK: Electrical lifetime estimation of a relay by accelerated life test. The Korean society of mechanical engineers, Proceedings 32 (5): 430-436, 2008.
  11. Agarwal V, Bhattacharyya C, Niranjan T, Susarla S: Discovering rules from disk event for predicting hard disk failure. Machine learning and applications, ICMLA 09 International Conference, pp 782-786, 2009.