Journal of the Korean Society for Precision Engineering (한국정밀공학회지)

Korean Society for Precision Engineering (한국정밀공학회)
권호 표지
DOI QR코드

DOI QR Code

Analysis of Heat Generation Induced by Electron Impact in X-Ray Tube Using FEM and Monte Carlo Method

유한요소법과 몬테카를로법을 이용한 X선 튜브에서 전자빔 충격에 의한 열 발생 해석

  • Kim, Heungbae (Department of Mechanical and Automotive Engineering, Dong Seoul College) ;
  • Yoo, Tae Jae (Department of Mechanical and Automotive Engineering, Dong Seoul College)
  • 김흥배 (동서울대학교 항공기계공학부) ;
  • 유태재 (동서울대학교 항공기계공학부)
  • Received : 2014.12.30
  • Accepted : 2015.03.17
  • Published : 2015.04.01
Download PDF
⟨ Previous Next ⟩

Abstract

We analyze heat generation as well as temperature distribution induced by accelerated electron impact on a target in a closed x-ray tube. For the sake of accuracy, we use Monte carlo analysis. This method gives accurate energy deposit in a medium with additional information such as secondary and backscattered electron as well as their paths. A Tungsten coated layer is divided by small rectangular cell which accumulate energy loss of primary electron beam. The cells and their accumulated energy datum are used for the input of finite element analysis. The Maximum temperature rising and temperature distribution were analyzed by transient heat analysis. Some temperature parameters such as target size and coating thickness were varied to investigate temperature sensitivity. Temperatures were compared each other to find primary variable that affect temperature rising on the x-ray target. The results will be helpful in development highresolution x-ray tube and related industries.

Keywords

References

  1. Sun, Z. and Karppi, R., "The Application of Electron Beam Welding for the Joining of Dissimilar Metals: An Overview," Journal of Materials Processing Technology, Vol. 59, No. 3, pp. 257-267, 1996. https://doi.org/10.1016/0924-0136(95)02150-7
  2. Hanke, R., Fuchs, T., and Uhlmann, N., "X-Ray Based Methods for Non-Destructive Testing and Material Characterization," Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 591, No. 1, pp. 14-18, 2008.
  3. Silverman, J. P., "X-Ray Lithography: Status, Challenges, and Outlook for 0.13um," Journal of Vacuum Science & Technology B, Vol. 15, No. 6, pp. 2117-2124, 1997. https://doi.org/10.1116/1.589231
  4. Tian, Y., Wang, C., Zhu, D., and Zhou, Y., "Finite Element Modeling of Electron Beam Welding of a Large Complex Al Alloy Structure by Parallel Computations," Journal of Materials Processing Technology, Vol. 199, No. 1-3, pp. 41-48, 2008. https://doi.org/10.1016/j.jmatprotec.2007.07.045
  5. Xavis Co. Ltd., "Xavis X-ray Device," http://www.xavis.co.kr/04customer/sub04_3.asp (Accessed 23 March 2015)
  6. Techvally Co. Ltd., "Techvally X-ray Device," http://www.techvalley.co.kr/products/normal-ct/ (Accessed 23 March 2015)
  7. Kim, H. B., "Development of Ion Beam Monte Carlo Simulation and Analysis of Focused Ion Beam Processing," J. Korean Soc. Precis. Eng., Vol. 29, No. 4, pp. 479-486, 2012. https://doi.org/10.7736/KSPE.2012.29.4.479
  8. Kim, H. B., "Development of Electron Beam Monte Carlo Simulation and Analysis of SEM Imaging Characteristics," J. Korean Soc. Precis. Eng., Vol. 29, No. 5, pp. 554-562, 2012. https://doi.org/10.7736/KSPE.2012.29.5.554
  9. GE Co., "Inspection & NDT," http://www.gemcs.com/en/phoenix-xray.html (Accessed 23 March 2015)
  10. Ansys Inc., "Ansys Multiphysics Solution," http://www.ansys.com/Products/Simulation+Technology/Multiphysics (Accessed 23 March 2015)