Applied Microscopy

Korean Society of Microscopy (한국현미경학회)
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Reconstruction of Neural Circuits Using Serial Block-Face Scanning Electron Microscopy

  • Kim, Gyu Hyun (Laboratory of Synaptic Circuit Plasticity, Department of Structure & Function of Neural Network, Korea Brain Research Institute) ;
  • Lee, Sang-Hoon (Research Equipment Core Facility Team, Korea Brain Research Institute) ;
  • Lee, Kea Joo (Laboratory of Synaptic Circuit Plasticity, Department of Structure & Function of Neural Network, Korea Brain Research Institute)
  • Received : 2016.06.21
  • Accepted : 2016.06.25
  • Published : 2016.06.30
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Abstract

Electron microscopy is currently the only available technique with a spatial resolution sufficient to identify fine neuronal processes and synaptic structures in densely packed neuropil. For large-scale volume reconstruction of neuronal connectivity, serial block-face scanning electron microscopy allows us to acquire thousands of serial images in an automated fashion and reconstruct neural circuits faster by reducing the alignment task. Here we introduce the whole reconstruction procedure of synaptic network in the rat hippocampal CA1 area and discuss technical issues to be resolved for improving image quality and segmentation. Compared to the serial section transmission electron microscopy, serial block-face scanning electron microscopy produced much reliable three-dimensional data sets and accelerated reconstruction by reducing the need of alignment and distortion adjustment. This approach will generate invaluable information on organizational features of our connectomes as well as diverse neurological disorders caused by synaptic impairments.

Keywords

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