DOI QR코드

DOI QR Code

Evaluating Interfacial Adhesion Properties of Pt/Ti Thin-Film by Using Acousto-Optic Technique

Acousto-Optic 기법을 이용한 Pt/Ti 박막 계면의 접합특성 평가

  • Park, Hae-Sung ;
  • Didie, David (Southeastern Louisiana University Department of Chemistry and Physics) ;
  • Yoshida, Sanichiro (Southeastern Louisiana University Department of Chemistry and Physics) ;
  • Park, Ik-Keun (Department of Mechanical and Automotive Engineering, Seoul National University of Science and Technology)
  • 박해성 (서울과학기술대학교 대학원 기계공학과) ;
  • ;
  • ;
  • 박익근 (서울과학기술대학교 기계.자동차공학과)
  • Received : 2016.01.18
  • Accepted : 2016.03.18
  • Published : 2016.06.30

Abstract

We propose an acousto-optic technique for the nondestructive evaluation of adhesion properties of a Pt/Ti thin-film interface. Since there are some problems encountered when using prevailing techniques to nondestructively evaluate the interfacial properties of micro/nano-scale thin-films, we applied an interferometer that combined the acoustic and optical methods. This technique is based on the Michelson interferometer but the resultant surface of the thin film specimen makes interference instead of the mirror when the interface is excited from the acoustic transducer at the driving frequency. The thin film shows resonance-like behavior at a certain frequency range, resulting in a low-contrast fringe pattern. Therefore, we represented quantitatively the change in fringe pattern as a frequency spectrum and discovered the possibility that the interfacial adhesion properties of a thin film can be evaluated using the newly proposed technique.

본 연구에서는 Pt/Ti 박막과 기판 사이 계면의 접합특성을 비파괴적으로 평가하는 acousto-optic 기법을 제안한다. 현재 상용화된 기술만으로 마이크로/나노 스케일의 박막을 평가하는데 많은 어려움이 있기 때문에 미세구조 변화에 민감한 광학기술과 음향기술이 결합된 간섭계를 적용하여 연구를 수행하였다. 사용한 기법은 마이켈슨 간섭계를 기반으로 하며, 거울에 의한 광 경로차 대신 박막시험편 계면의 진동 영향에 따라 발생하는 간섭현상을 분석하였다. 박막시험편은 특정 주파수에서 공진과 유사한 현상을 보이고 이로 인해 프린지 패턴의 콘트라스트가 낮아지므로, 각 주파수 대역별 프린지 패턴 변화를 스펙트럼 결과로 정량화하여 제안된 기법을 이용한 박막의 접합특성 평가 가능성을 확인하였다.

Keywords

References

  1. W. N. Sharpe Jr, B. Yuan and R. L. Edwards, "A new technique for measuring the mechanical properties of thin films," Journal of Microelectromechanical Systems, Vol. 6, No. 3, pp. 193-199 (1997) https://doi.org/10.1109/84.623107
  2. C. A. Neugebauer, J. D. Newkirk and D. A. Vermilyea (Eds.) "Structure and Properties of Thin Films," Wiley, New York (1959)
  3. Y. Kim, "Elastic modulus measurement of thin film using a dynamic method," Journal of Electronic Materials, Vol. 26, No. 9, pp. 1002-1008 (1997) https://doi.org/10.1007/s11664-997-0237-y
  4. S. Yoshida, D. Didie, D. Didie, S. Adhikari and I. K. Park, "Opto-acoustic technique to investigate interface of thin-film systems," Advancement of Optical Methods in Experimental Mechanics, Vol. 3, pp. 117-125 (2015)
  5. R. Buzio and U. Valbusa, "Interfacial stiffness and adhesion of randomly rough contacts probed by elastomer colloidal AFM probes," Journal of Physics: Condensed Matter, Vol. 20, No. 35, 354014 (2008) https://doi.org/10.1088/0953-8984/20/35/354014
  6. B. B. Jung, H. K. Lee, K. H. Hwang and H. C. Park, "Observation of size effect and measurement of mechanical properties of Ti thin film by bulge test," Transaction of the Korean Society of Mechanical Engineers B, Vol. 37, No. 1, pp. 19-25 (2013) https://doi.org/10.3795/KSME-B.2013.37.1.019
  7. M. El-Shabasy, "Adhesion measurements of thin metallic films: comparison of the direct pull-off and the scratch methods," Periodica Polytechnica Electrical Engineering, Vol. 25, No. 4, pp. 283-290 (1981)
  8. D. R. Kwak, S. B. Cho and I. K. Park, "Evaluation of elastic properties for nanoscale coating layers using ultrasonic atomic force microscopy," Journal of the Korean Society of Manufacturing Technology Engineers, Vol. 24, No. 5, pp. 475-480 (2015) https://doi.org/10.7735/ksmte.2015.24.5.475
  9. I. K. Park, S. Yoshida, D. Didie, H. Park, D. Didie and S. Ghimire, "Simultaneous application of acoustic and optical techniques to nondestructive evaluation," Advancement of Optical Methods in Experimental Mechanics, Vol. 3, pp. 135-142 (2015)
  10. E. Hecht, "Optics," 4th Ed., Addison-Wesley, pp. 407-411 (2002)
  11. S. Adhikari, "Evaluation of thin-films adhesion coating with michelson interferometer," B.Sc. Thesis, Southeastern Louisiana University (2014)
  12. P. F. Flowers, S. Yoshida, K. Gomi, S. Adhikari, K. Dreux, M. Basnet, C. Miyasaka, B. R. Tittmann and I. K. Park, "Evaluation of thin film coating adhesion with an opto-acoustic technique," IEEE International Ultrasonics Symposium (IUS), pp. 1103-1106 (2011)
  13. R. Bracewell, "The Fourier Transform and Its Applications," McGraw-Hill, New York, pp. 1-7 (1965)
  14. R. J. Higgins, "Fast Fourier transform: An introduction with some minicomputer experiments," American Journal of Physics, Vol. 44, No. 8, pp. 766-773 (1976) https://doi.org/10.1119/1.10128
  15. H. S. Park, D. Didie, D. Didie, S. Yoshida, I. K. Park, S. B. Cho and T. Sasaki, "Nondestructive characterization of thin film system with dual-beam interferometer," In Residual Stress, Thermomechanics & Infrared Imaging, Hybrid Techniques and Inverse, Vol. 9, pp. 129-137 (2016)