The Transactions of The Korean Institute of Electrical Engineers (전기학회논문지)

The Korean Institute of Electrical Engineers (대한전기학회)
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Measurement errors of the EIT systems using a phantom and conductive yarns

전기임피던스 단층촬영법을 이용한 외란위치 계측오차

  • Park, Ji Su (Center for Bionics, Biomedical Research Institute, Korea Institute of Science and Technology (KIST)) ;
  • Koo, Sang-Mo (Dept. of Electronic Materials Engineering, Kwangwoon University) ;
  • Kim, Choong Hyun (Center for Bionics, Biomedical Research Institute, Korea Institute of Science and Technology (KIST))
  • Received : 2016.01.29
  • Accepted : 2016.07.06
  • Published : 2016.08.01
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Abstract

Electrical impedance tomography (EIT) has been applied to measure the location of external disturbance using a phantom and conductive yarns. According to the test results, the addition of carbon nanotube particles into the phantom does not show remarkable improvement in location errors. On the other hand combined fabric, conductive yarns with fabric, and non-woven fabric, were added to evaluate its performance as a fabric sensor. The combined fabric resulted in a decrease of 21.5% in the circumferential location error and a decrease of 50% in the radial location error, compared to those of the yarns. Additionally, it was revealed that the measurement error is almost linearly proportional to the conductivity of the phantom liquid and resistance of the conductive yarns. The combined fabric can be a promising material for fabric sensors in sports utilities and medical devices.

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References

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