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Mechanical and Electrical Failure of ITO Film with Different Shape during Twisting Deformation

비틀림 변형 중 ITO 필름의 시편 형태에 따른 기계적 전기적 파괴 연구

  • Kwon, Y.Y. (School of Materials Science & Engineering, Andong National University) ;
  • Kim, Byoung-Joon (School of Materials Science & Engineering, Andong National University)
  • 권용욱 (안동대학교 신소재공학부 청정에너지소재기술연구센터) ;
  • 김병준 (안동대학교 신소재공학부 청정에너지소재기술연구센터)
  • Received : 2017.11.29
  • Accepted : 2017.12.22
  • Published : 2017.12.31

Abstract

The most representative transparent electrode in the modern society is ITO (Indium Tin Oxide). ITO is widely used in general for touch panels and displays due to its high electrical and optical properties. However, in general, mechanical deformation causes deterioration and destruction of device properties because ITO is basically vulnerable to mechanical deformation. Therefore, the in-depth understanding on the stability of ITO film during various mechanical deformations is necessary. In this study, the reliability and mechanical properties ITO sample having different length, width, and area were investigated. The electrical stability was estimated according to electrical resistance change. The stability was dropped as the sample length, and width increased and the sample area decreased. The electrical stability of ITO film was correlated with twisting strain including tensile, compressive and shear stress.

현재 전자 기기에서 가장 대표적인 투명전극은 ITO(Indium Tin Oxide) 필름으로, 우수한 전기적 물성과 광학적 성질로 인해 터치패널, 발광 소자 등 다양한 곳에 사용 중이다. 하지만, 세라믹 재료가 가지는 취성으로 인해, 유연 전자 소자와 같은 곳에 적용할 경우 기계적 변형 중 취성 파괴가 일어나기 쉬우므로 각별한 주의가 필요하다. 본 연구에서는 PET 위에 증착한 ITO 필름에 비틀림 변형이 가해졌을 경우 나타나는 기계적 파괴 및 이에 따라 발생하는 전기적 물성 변화에 대해 연구하였다. 다양한 형태의 시편을 준비하여 비틀림 변형 시 ITO 필름의 전기적 안정성에 대해 연구하였고, 시편의 길이가 길수록 폭이 클수록 면적이 작을수록 비틀림 변형에 취약한 것으로 나타났다. 이를 비틀림 변형 시 발생하는 복합 응력을 고려하여 ITO 필름의 비틀림 안정성에 대해 연구하였다.

Keywords

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