JSTS:Journal of Semiconductor Technology and Science

The Institute of Electronics and Information Engineers (대한전자공학회)
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A Study on Shear-stress Calibration by the Mid-point Measurements in +45/-45 Degree Semiconductor Resistor-pair

  • Cho, Chun-Hyung (Department of Electronic & Electrical Engineering, College of Science and Technology, Hongik University) ;
  • Cha, Ho-Young (School of Electronic & Electrical Engineering, College of Engineering, Hongik University) ;
  • Sung, Hyuk-Kee (School of Electronic & Electrical Engineering, College of Engineering, Hongik University)
  • Received : 2016.08.09
  • Accepted : 2016.10.16
  • Published : 2017.04.30
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Abstract

In this research, we proposed the simple and efficient method to calculate the shear stresses by using the mid-point measurements in ${\pm}45^{\circ}$ semiconductor resistor-sensor pair. Compared to the previous works, the measurements became much simpler by combining the approximation theory with the technique of mid-point measurement. In addition, we proposed another novel method for the stress calculation in which we could increase the sensitivity of the stress sensor by controlling the applied voltage between the sensor-pair. For the applied voltage of 8 V, the sensitivity showed a significant increase by 100%.

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References

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