Journal of the Microelectronics and Packaging Society (마이크로전자및패키징학회지)

The Korean Microelectronics and Packaging Society (한국마이크로전자및패키징학회)
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3-Dimensional Shape Inspection for Micro BGA by LED Reflection Image

LED 반사영상을 이용한 마이크로 BGA 3차원형상검사

  • Kim, Jee Hong (Department of Display Engineering, Pukyong National University)
  • 김지홍 (부경대학교 융합디스플레이공학과)
  • Received : 2017.04.12
  • Accepted : 2017.06.26
  • Published : 2017.06.30
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Abstract

An optical method to inspect the 3-D shape of surface of Micro BGA is proposed, where spatially arranged LED light sources and specular reflection are considered. The reflected image captured by a vision system was analyzed to calculate the relative displacements of LED's in the image. Also, the statistics for all BGA's contained in a captured image are used together to find out the criteria for the detection of existing defects, and the usefulness of the proposed method is shown via experiments.

본 논문은 마이크로 BGA(Ball Grid Array)의 3차원 형상 검사를 위한 광학적 방법에 관한 것으로, 특히, LED를 공간적으로 배치한 광원과 경면반사특성을 이용하였다. 이를 위해 비전시스템을 구성하여 BGA의 반사영상을 취득한 후, 영상처리를 통하여 반사된 LED 점광원의 위치를 추출하여 형상검사에 이용하였다. 또한, 영상에 포함된 복수개의 BGA에 대한 상대적 위치의 통계치를 이용하여 BGA 3차원 형상의 결함을 판단하는 방법을 제안하였고, 실험을 통하여 제안된 방법의 효용성을 보였다.

Keywords

References

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