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전영역 스캐닝 자유공간 측정 시스템을 이용한 GFRP의 유전율 분포 가시화

Visualization of Permittivity Distribution in GFRP using Full-Field Scanning Free Space Measurement System

  • Hyun, Jong-Min (Department of Aerospace Engineering, Korea Advanced Institute of Science and Technology) ;
  • Ahmed, Hasan (Department of Aerospace Engineering, Korea Advanced Institute of Science and Technology) ;
  • Lee, Jung-Ryul (Department of Aerospace Engineering, Korea Advanced Institute of Science and Technology)
  • 투고 : 2018.03.07
  • 심사 : 2018.05.09
  • 발행 : 2018.06.29

초록

본 연구에서는 스캐닝 자유공간 측정 시스템을 이용하여 전자기적 특성을 가지는 표준 시편에 대한 전영역 유전율 분포를 가시화한다. 먼저 테플론 두께 차이에 따라, 유전율 측정 결과, 유전율 실수와 손실정접 측정결과가 두께변화에도 타측정과 이론치와 비교하여 신뢰할 수 있는 결과를 획득하였고 이어 Glass/epoxy 시편에 적용하여 재료에 따라 다른 유전율 분포가 나타나는 것을 제시하였다. 스캔영역을 통해, 시편 전영역에 대한 유전율 분포를 가시화 할 수 있었으며, 재료 물성 평가를 넘어 레이돔 혹은 스텔스 구조 규모의 대상체에도 적용할 수 있음을 확인하였다.

This paper visualizes the full-field permittivity distribution at the standard specimens having known electromagnetic characteristics using a scanning free space measurement (SFSM) system. First, in the two Teflon specimens with different thicknesses, the real and loss tangent of permittivity could be measured and the results agreed to the theoretical and other measurement values. Then the system has been applied to Glass/epoxy and visualized different permittivity distribution depending on the material kind. Therefore, this approach will overcome the point measurement limitation of FSM and can be used for even sub-structural full-field electromagnetic evaluation of stealth and radome structures.

키워드

참고문헌

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피인용 문헌

  1. Anisotropy of W-band complex permittivity in Al2O3 vol.31, pp.22, 2018, https://doi.org/10.1088/1361-648x/ab0b09