Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지
DOI QR코드

DOI QR Code

A Study on Variation of Single Color by Applied Voltage in Multi-Electrode Type Electronic Film

다수전극형 전자종이 필름에서 인가전압에 따른 단일 컬러 가변에 관한 연구

  • Lee, Sang-Il (Department of Electronic Engineering Incheon National University) ;
  • Hong, Youn-Chan (Department of Electronic Engineering Incheon National University) ;
  • Kim, Young-Cho (Department of Electronic Engineering, Chungwoon University)
  • Received : 2018.07.31
  • Accepted : 2018.09.17
  • Published : 2018.11.01
Download PDF
⟨ Previous Next ⟩

Abstract

A multielectrode electronic paper film capable of expressing a single-color image was fabricated by injecting color electronic ink into an electronic paper panel; on the basis of its reflective or transparent properties, it is possible to control the expression of six single-color images and their transmittance. In this study, a single-color image was represented by driving a multielectrode electronic paper film; color coordinates were measured. The six capable single colors were yellowish pink (0.444, 0.354), white (0.355, 0.352), black (0.241, 0.241), orange (0.514, 0.360), reddish orange (0.606, 0.338), and reddish purple (0.469, 0.145). Color particles used in this paper were black and white, by which six colors are accomplished, but more single-color images can be combined by using cyan, magenta, and yellow particles.

Keywords

References

  1. D. J. Lee and Y. C. Kim, J. Disp. Technol., 9, 972 (2013). [DOI: https://doi.org/10.1109/JDT.2013.2273125]
  2. D. J. Lee, Y. M. Oh, S. W. Park, B. E. Park, and Y. C. Kim, J. Disp. Technol., 8, 361 (2012). [DOI: https://doi.org/10.1109/JDT.2012.2190135]
  3. R. Sakurai, S. G. Lee, W. K. Cho, B. G. Ryu, and M. B. Song, IMID DIGEST, 5, 423 (2005).
  4. C. W. Kim and Y. C. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 23, 691 (2010). [DOI: https://doi.org/10.4313/JKEM.2010.23.9.691]
  5. J. S. Kim and Y. C. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 24, 669 (2011). [DOI: https://doi.org/10.4313/JKEM.2011.24.8.669]
  6. I. H. Kim and Y. C. Kim, J. Korean Acad.-Ind. Coop. Soc., 10, 1175 (2009). [DOI: https://doi.org/10.5762/KAIS.2009.10.6.1175]
  7. C. A. Kim, S. Y. Kang, G. H. Kim, S. D. Ahn, J. Oh, and K. S. Suh, Mol. Cryst. Liq. Cryst., 499, 282 (2009). [DOI: https://doi.org/10.1080/15421400802619578]
  8. S. I. Lee and Y. C. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 28, 109 (2015). [DOI: https://doi.org/10.4313/JKEM.2015.28.2.109]
  9. J. S. Kim and Y. C. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 25, 48 (2012). [DOI: https://doi.org/10.4313/JKEM.2012.25.1.48]
  10. D. J. Lee, B. E. Park, and Y. C. Kim, J. Disp. Technol., 8, 534 (2012). [DOI: https://doi.org/10.1109/JDT.2012.2199280]
  11. S. I. Lee, Y. C. Hong, and Y. C. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 29, 231 (2016). [DOI: https://doi.org/10.4313/JKEM.2016.29.4.231]
  12. S. I. Lee, Y. C. Hong, and Y. C. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 31, 171 (2018). [DOI: https://doi.org/10.4313/JKEM.2018.31.3.171]
  13. Y. K. Shin and Y. C. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 28, 21 (2015). [DOI: https://doi.org/10.4313/JKEM.2015.28.1.21]
  14. H. L. Kang, C. A. Kim, S. I. Lee, Y. K. Shin, Y. H. Lee, Y. C. Kim, and B. K. Ju, J. Disp. Technol., 12, 742 (2016). [DOI: https://doi.org/10.1109/JDT.2016.2524023]