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A Study on Electric Properties of Polyamide Film due to Temperature Change

  • Lee, Sung Ill (Department of Safety Engineering, Korea National University of Transportation)
  • Received : 2018.11.27
  • Accepted : 2019.02.28
  • Published : 2019.03.31

Abstract

In this study, we measured the leakage current at $30{\sim}80^{\circ}C$ and $90{\sim}170^{\circ}C$ under a voltage of 200~980 V applied to samples (ordinary temperature) and polyamide film specimens degraded at $170^{\circ}C$ for 20 minute respectively. After the specimen was degraded at $130^{\circ}C$ and $50^{\circ}C$, a voltage of 200 to 800 V was applied for 10 to 60 minutes. The measurement of the leakage current resulted in the following conclusions. In the case of using Al and Cu as the main electrode, it was confirmed that the leakage current also increased in high temperatures as the voltage increased. Regardless of the type of main electrode, when the temperature was constant at $130^{\circ}C$ and $50^{\circ}C$, the leakage current increased as the voltage increased, and gradually decreased with time. As a result of the FTIR measurement, the main absorption of the infrared absorption spectrum was C=O at about $1650cm^{-1}$ and N-H diagonal vibration occurred at around $1550cm^{-1}$. There was no change in the material, so no effect of temperature was observed. By the results of SEM measurements, as the temperature of degradation increases, cracks in the specimen disappear. This may be because the amide bond (-CO-NH-) is absorbed by the material.

Keywords

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Figure 1. Measuring circuit.

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Figure 2. Specimen and electrode Scale.

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Figure 3. Temperature properties of leakage current vs. voltage of polyamide film specimens attached main electrode Al due to thermally degradation at 30~170℃.

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Figure 4. Temperature properties of leakage current vs. voltage (V) of polyamide film specimens attached with main electrode Cu due to thermally degradation at 30-170℃.

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Figure 5. Voltage (200V-800V) properties of leakage current vs. time (60 min) of polyamide film specimens attached with Al at 130 ℃ & 50℃.

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Figure 6. Voltage (200V-800V) properties of leakage current vs. time (60 min) of polyamide film specimens attached with Cu 130 ℃ & 50℃.

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Figure 7. FTIR Analysis of specimen (a) 20 min at 170℃ (b) not degradation.

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Figure 8. SEM Analysis of specimen (a) 20 minute at 170℃ (b) not degradation.

Table 1. Measure Conditions of Polyamide Film Specimen with Al and Cu

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