A study of the system that enables real-time contact confirmation of probes in OLED panel inspection

OLED Panel 검사 시에 Probe의 실시간 Contact 확인 가능한 시스템에 관한 연구

  • Hwang, Mi-Sub (Department of Mechanical Engineering, Inha University) ;
  • Han, Bong-Seok (Department of Mechanical Engineering, Inha University) ;
  • Han, Yu-Jin (Department of Mechanical Engineering, Inha University) ;
  • Choi, Doo-Sun (Department of Mechanical Engineering, Inha University) ;
  • Kim, Tae-Min (Department of Mechanical Engineering, Inha University) ;
  • Park, Kyu-Bag (Department of Mechanical Engineering, Inha University) ;
  • Lee, Jeong-woo (Department of Mechanical Engineering, Inha University) ;
  • Kim, Ji-Hun (Department of Mechanical Engineering, Inha University)
  • 황미섭 (인하대학교 기계공학과) ;
  • 한봉석 (인하대학교 기계공학과) ;
  • 한유진 (인하대학교 기계공학과) ;
  • 최두선 (인하대학교 기계공학과) ;
  • 김태민 (인하대학교 기계공학과) ;
  • 박규백 (인하대학교 기계공학과) ;
  • 이정우 (인하대학교 기계공학과) ;
  • 김지훈 (인하대학교 기계공학과)
  • Received : 2020.04.10
  • Accepted : 2020.06.30
  • Published : 2020.06.30

Abstract

Recently, LCD (Liquid Crystal Display) has been replaced by OLDE (Organic Light Emitting Diode) in high resolution display industry. In the process of OLDE production, it inspects defective products by sending a signal using a probe during OLED panel inspection. At this time, the cause of the detection of failure is divided into two. One is the self-defect of the OLED panel and the other is the poor contact occurring in the process of contact between the two. The second case is unknown at the time of testing, which increases the time for retesting. To this end, we made a system that can identify in real time whether the probe is in contact during the inspection. A contact probe unit was designed for the system, and a stage system was implemented. An inspection system was constructed through S / W and circuit configuration for actual inspection. Finally, a system that can check contact and non-contact in real time was constructed.

Keywords

References

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