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Low Voltage Ride Through Test for Smart Inverter in Power Hardware in Loop System

전력 HILs를 활용한 스마트 인버터의 LVRT 시험

  • Sim, Junbo (KEPCO Research Institute, Korea Electric Power Corporation)
  • Received : 2021.03.29
  • Accepted : 2021.04.06
  • Published : 2021.06.30

Abstract

Encouragement of DER from Korean government with several policies boosts DER installation in power system. When the penetration of DER in the grid is getting high, loss of generation with break-away of DER by abnormal grid conditions should be considered, because loss of high generation causes abnormal low frequency and additional operations of protection system. Therefore, KEPCO where is Korean power utility is preparing improvement in regulations for DERs connected to the grid to support abnormal grid conditions such as low and high frequencies or voltages. This is called 'Ride Through' because the requirement is for DER to maintain grid connection during required periods when abnormal grid conditions occur. However, it is not easy to have a test for ride through capability in reality because emulation of abnormal grid conditions is not possible in real power system in operation. Also, it is not easy to have a study on grid effect when ride through capability fails with the same reason. PHILs (Power Hardware In the Loop System) makes it possible to analyze power system and hardware performance at once. Therefore, this paper introduces PHILs test methods and presents verification of ride through capability especially for low voltage grid conditions.

Keywords

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