한국전기전자재료학회논문지 (Journal of the Korean Institute of Electrical and Electronic Material Engineers)

  • 제36권5호
  • /
  • Pages.520-524
  • /
  • 2023
  • /
  • 1226-7945(pISSN)
  • /
  • 2288-3258(eISSN)
한국전기전자재료학회 (The Korean Institute of Electrical and Electronic Material Engineers)
권호 표지
DOI QR코드

DOI QR Code

고역통과 필터 및 FFT를 이용하여 아크감지 알고리즘 검증

Verification of Algorithm for Arc Detection Using High Pass Filter and FFT

  • Min-Ho Yoon (Department of Electrical Engineering, Soongsil University) ;
  • You-Jung Cho (Department of Electrical Engineering, Soongsil University) ;
  • Kyoung-Tak Kim (Department of Electrical Engineering, Soongsil University) ;
  • Sung-Hun Lim (Department of Electrical Engineering, Soongsil University)
  • 투고 : 2023.07.03
  • 심사 : 2023.08.07
  • 발행 : 2023.09.01
PDF 다운로드
⟨ 이전 논문 다음 논문 ⟩

초록

An algorithm was developed to detect and block serial arc currents using HPF. The AC series arc problem is that the load current is greater than the fault current and no leakage current occurs. As a solution, an arc detection method utilizing differences in high- frequency amplitudes was developed. HPT was applied to the load current and FFT was applied to eliminate low frequencies. An algorithm has been developed to detect arc waveforms when they exceed a certain value compared to the average of normal waveforms. Using one cycle of data, arc detection is faster and arc accidents are prevented.

키워드

과제정보

This work was supported by the Energy R & D program of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) granted financial resource from the Ministry of Trade, Industry & Energy, Republic of Korea (No.20215910100020).

참고문헌

  1. Electrical Disaster Statistics Report, Korea Electrical Safety Corporation, 2021, https://kes.go.kr/web/lay1/bbs/S1T110C291/F/101/view.do?article_seq=962&cpage=1&rows=6&condition=&keyword
  2. Underwriters Laboratories, Standard 1699-Standard for Arc-Fault Circuit-Interrupters, 2006, https://global.ihs.com/doc_detail.cfm?document_name=UL%201699&item_s_key=00308197
  3. G. D. Gregory, K. Wong, and R. F. Dvorak, IEEE Trans. Ind. Appl., 40, 1006 (2004). doi: https://doi.org/10.1109/TIA.2004.831287 
  4. W. Luan, J. Lin, B. Liu, and B. Zhao, Electr. Power Syst. Res., 210, 108113 (2022). doi: https://doi.org/10.1016/j.epsr.2022.108113 
  5. H. Zhao, J. Liu, and J. Lou, Electr. Power Syst. Res., 202, 107626 (2021). doi: https://doi.org/10.1016/j.epsr.2021.107626 
  6. K. Dowalla, P. Bilski, R. Lukaszewski, A. Wojcik, and R. Kowalik, Energies, 16, 171 (2023). doi: https://doi.org/10.3390/en16010171 
  7. J. Lezama, P. Schweitzer, S. Weber, E. Tisserand, and P. Joyeux, Proc. 2014 IEEE 60th Holm Conference on Electrical Contacts (Holm) (IEEE, New Orleans, USA, 2014) p. 1. doi: https://doi.org/10.1109/HOLM.2014.7031017 
  8. M. K. Khafidli, E. Prasetyono, D. O. Anggriawan, A. Tjahjono, M.H.R.A. Syafii, Proc. 2018 International Electronics Symposium on Engineering Technology and Applications (IESETA) (IEEE, Bali, Indonesia, 2018) p. 31. doi: https://doi.org/10.1109/ELECSYM.2018.8615529 
  9. H. Cheng, X. Chen, F. Liu, and C. Wang, Proc. 2010 Asia-Pacific Power and Energy Engineering Conference (IEEE, Chengdu, China, 2010) p. 1. doi: https://doi.org/10.1109/APPEEC.2010.5448958