• Title/Summary/Keyword: %24CdWO_4%24

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The Change of Collected Light According to Changing of Reflectance and Thickness of CdWO4 Scintillator for High Energy X-ray Imaging Detection (고에너지 X-선 영상검출을 위한 CdWO4 섬광체 두께와 반사체의 반사율 변화에 따른 광 수집량의 변화)

  • Lim, Chang Hwy;Park, Jong-Won;Lee, Junghee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.24 no.12
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    • pp.1704-1710
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    • 2020
  • The high-energy X-ray imaging detector used for container inspection uses a thick scintillator to effectively acquire X-rays. X-ray incident on the scintillator is generally up to 9MeV. Therefore, to effectively collect X-ray, it is necessary to use a thick scintillator. To collect the light generated by the reaction between X-ray and scintillator, an optical-sensor must be combined with the scintillator. In this study, a study on the design conditions of the detector using a CdWO4 and a small sensor is described. To calculate the collected light according to the change of the scintillator thickness and the reflectance of surface, MCNP6 and DETECT2000 were used. As a result of calculating, it was confirmed that when the reflectance of the surface was low, it was appropriate to select a scintillator with a thickness of 15 to 20-mm, but as the reflectance increased, it was confirmed that it was appropriate to select a CdWO4 with a thickness of 25 to 30-mm.