• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.395-395
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• 2011

일반적으로 태양전지에서 anti-reflection layer는 조사되는 태양 광을 좀 더 많이 사용하기 위하여 nitride나 oxide와 같은 막을 표면에 형성한다. 본 연구는 이 anti-reflection으로 사용되는 nitride와 oxide의 각각의 두께와 굴절률 변화에 따른 특성변화를 SILVACO를 이용하여 전산모사하고 그 특성변화를 분석하였다. Anti-reflection layer가 없을 경우에는 조사된 빛에 따른 available photo current 활용이 낮았으며, 특히 그 경향은 단파장영역에서 두드러지게 나타났다. 따라서 anti-reflection layer의 최적화를 위해서 두께를 가변하여 available photo current를 분석하였으며, 각 물질의 굴절률 변화 및 이중층 구조의 anti-reflection layer를 형성하고 특성변화를 분석함으로써 최적화하였다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.11a
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• pp.127-127
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• 2009

The most important part of the fabrication solar cells is the anti-reflection coating when excludes the kinds of silicon substrates (crystalline, polycrystalline, or amorphous), patterns and materials of electrodes. Anti-reflection coatings reduce the reflection of sunlight and at last increase the intensity of radiation to inside of solar cells. So, we can obtain increase of solar cell efficiency about 10% using anti-reflection coating. There are many kinds of anti-reflection film for solar cell, such as SiN, $SiO_2$, a-Si, and so on. And, they have two functions, anti-reflection and passivation. However such materials could not perfectly prevent reflection. So, in this work, we investigated the anti-reflection coating with the columnar structure ZnO thin film. We synthesized columnar structure ZnO film on glass substrates. The ZnO films were synthesized using a RF magnetron sputtering system with a pure (99.95%) ZnO target at room temperature. The anti-reflection coating layer was sputtered by argon and oxygen gases. The angle of target and substrate measures 0, 20, 40, 60 degrees, the working pressure 10 mtorr and the 250 W of RF power during 40 minutes. The confirm the growth mechanism of ZnO on columnar structure, the anti-reflection coating layer was observed by field emission scanning electron microscopy (FE-SEM). The optical trends were observed by UV-vis and Elleso meter.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.12a
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• pp.103-106
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• 2006

Semiconductor laser diode has a reflective facet in a both-ends side fundamentally. Laser performance for improving, Anti-Reflection and High-reflection coating on the facet of semiconductor laser diode. To prevent internal feedback from both facets for realizing superluminescent diode and reducing the reflection-induced intensity noise of laser diode, it's key techniques are AR/HR coatings. In the study AR coating film were manufactured by Ion-Assisted Deposition(IAD) system. Then manufactured coating film measurement electrical properties(L-I-V, Se, Resistor) and Optical properties (wavelength FFP)

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.06a
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• pp.424-425
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• 2007

Anti-Reflection and High-reflection coating on the facet of semiconductor laser diode. To prevent internal feedback from both facets for realizing super luminescent diode and reducing the reflection-induced intensity noise of laser diode. Anti-Reflection coating Film was designed by Macleod Simulator. Coating Materials were decided $Ti_3O_5$ and $SiO_2$. Thickness of Coating layer $Ti_3O_5/SiO_2$ were 105[nm], 165[nm]. In the study Anti-Reflection coating Film was design for Laser diode and deposited by Ion-Assisted Deposition system. Then manufactured thin film measured electrical properties(L-I-V, Se, Resistor) and Optical properties(wavelength FFP). Slop-efficiency and FFP characteristic is 0.302[W/A], $22.3^{\circ}$(Horizontal), $24.4^{\circ}$(Vertical).

• Bulletin of the Korean Mathematical Society
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• v.46 no.3
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• pp.511-519
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• 2009

A matrix $P{\in}\mathbb{C}^{n{\times}n}$ is called a generalized reflection matrix if $P^*$ = P and $P^2$ = I. An $n{\times}n$ complex matrix A is said to be a reflexive (anti-reflexive) matrix with respect to the generalized reflection matrix P if A = PAP (A = -PAP). It is well-known that the reflexive and anti-reflexive matrices with respect to the generalized reflection matrix P have many special properties and widely used in engineering and scientific computations. In this paper, we give new necessary and sufficient conditions for the existence of the reflexive (anti-reflexive) solutions to the linear matrix equation AXB + CY D = E and derive representation of the general reflexive (anti-reflexive) solutions to this matrix equation. By using the obtained results, we investigate the reflexive (anti-reflexive) solutions of some special cases of this matrix equation.

• 한국신재생에너지학회:학술대회논문집
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• 2010.06a
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• pp.90.2-90.2
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• 2010

The crystalline silicon solar cells have been optical losses. but it can be reduced using light trapping by texture structure and anti-reflection coating. The high reflective index of crystalline silicon at solar wavelengths(400nm~1000nm) creates large reflection losses that must be compensated for by applying anti-reflection coating. In this study, the use of porous silicon(PSi) as an active material in a solar cell to take advantage of light trapping and blue-harvesting photoluminescence effect. Porous silicon is form by anodization and can be obtained in an electrolyte with hydrofluoric. We expect our research can results approaching to lower than 10% of several reflectance by porous silicon solar cells.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.06a
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• pp.408-409
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• 2007

Ferrule function have connect Optical Communication Cable. But Ferrule have important role that is decided transmission efficiency and information quality. Key-point of detailed drawing of ferrule is Anti-Reflection. In the study Broadband Anti-Reflection coating Film was design for ferrule of optical connector and deposited in low temperature by Ion-Assisted Deposition system. Optical thin film materials($Ta_2O_5$, $SiO_2$) were manufactured Index and Film thickness. $Ta_2O_5$ index is 2.123 ~ 2.125 and $SiO_2$ is 1.44 ~ 1.442. Reflection Loss of film deposited on Ferrule is 30.1[dB].

• Journal of Magnetics
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• v.13 no.2
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• pp.70-75
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• 2008

In this study, a MOKE (Magneto-optical Kerr effect) measurement method for magnetic nanostructures is proposed. Theoretically, the MOKE signal enhancement can be predicted and confirmed when an anti-reflection coated substrate is used. Since MOKE is a ratio of reflectivity and the difference between the reflectivities for two magnetic states, when the reflectivity of the substrate part is reduced by employing an anti-reflection coated substrate, MOKE signal enhancement can be achieved. The enhancement is confirmed by simple numerical MOKE calculations. When the reflectivity of an anti-reflection coated substrate is 0.7%, the calculated MOKE signal is about 79% of its bulk values for the 100-nm wide Fe nanowire with a 1500-nm radius laser beam. It was found that, for various numerical calculations, a larger MOKE signal is obtained relative to a smaller substrate reflectivity.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.287.2-287.2
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• 2014

PV (photovoltaic) has becoming an important industry to invest due to its high robustness and require very little maintenance which goes a long time. Solar cell fabrication involves a few critical processes such as doping to make the N-type and P-type silicon, contact metallization, surface texturization, and anti-reflection coatings. Anti-reflection coating is a kind of surface passivation which ensures the stability, and efficiency of the solar cell. Thus, I will focus on the changes happen to the solar cell due to the reflectance and anti-reflection coating by PC1D. By using the PC1D (solar cell simulation program), I would analysis the effect of reflectance on the N-type cell. At last I will conclude the result regarding what I learned throughout this experiment.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.06a
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• pp.221-222
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• 2008

In Crystalline Si solar cells, Anti-Reflection Coating is contribute to improvement in energy conversion efficiency due to decrease of optical loss and recombination owing to surface passivation. Porous Si is formed electrochemical etching that uses chemical solution and anodization etching. So It gives that advantage in rapid process time and without high cost equipment. In this paper, We compare Porous Si with $SiO_2$/SiNx ARC and analyze that by anti-reflection coating.